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中国科学院计算技术研究所机构知识库
Institute of Computing Technology, Chinese Academy IR
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出处:IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
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MRFI: An Open-Source Multiresolution Fault Injection Framework for Neural Network Processing
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 11
作者:
Huang, Haitong
;
Liu, Cheng
;
Xue, Xinghua
;
Liu, Bo
;
Li, Huawei
;
Li, Xiaowei
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2024/05/20
Biological neural networks
Hardware
Reliability
Computational modeling
Neural networks
Fault tolerant systems
Fault tolerance
Fault evaluation
fault injection
fault simulation
multiresolution
neural network reliability
In-Memory Wallace Tree Multipliers Based on Majority Gates Within Voltage-Gated SOT-MRAM Crossbar Arrays
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 8
作者:
Hui, Yajuan
;
Li, Qingzhen
;
Wang, Leimin
;
Liu, Cheng
;
Zhang, Deming
;
Miao, Xiangshui
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2024/05/20
In-memory computing
majority gates
voltage-gated SOT-MRAM
Wallace tree multiplier
Exploring Winograd Convolution for Cost-Effective Neural Network Fault Tolerance
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 11, 页码: 1763-1773
作者:
Xue, Xinghua
;
Liu, Cheng
;
Liu, Bo
;
Huang, Haitong
;
Wang, Ying
;
Luo, Tao
;
Zhang, Lei
;
Li, Huawei
;
Li, Xiaowei
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2024/05/20
Fault tolerant systems
Fault tolerance
Artificial neural networks
Convolution
Reliability
Computational modeling
Neurons
Fault-tolerance
soft errors
vulnerability analysis
winograd convolution (WG-Conv)
Soft Error Reliability Analysis of Vision Transformers
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11
作者:
Xue, Xinghua
;
Liu, Cheng
;
Wang, Ying
;
Yang, Bing
;
Luo, Tao
;
Zhang, Lei
;
Li, Huawei
;
Li, Xiaowei
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2023/12/04
ABFT
fault-tolerance
soft errors
vision transformers (ViTs)
vulnerability analysis
BitXpro: Regularity-Aware Hardware Runtime Pruning for Deep Neural Networks
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 1, 页码: 90-103
作者:
Li, Hongyan
;
Lu, Hang
;
Wang, Haoxuan
;
Deng, Shengji
;
Li, Xiaowei
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2023/07/12
Deep learning accelerator
deep neural network (DNN)
hardware runtime pruning
Taming Process Variations in CNFET for Efficient Last-Level Cache Design
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022, 卷号: 30, 期号: 4, 页码: 418-431
作者:
Xu, Dawen
;
Feng, Zhuangyu
;
Liu, Cheng
;
Li, Li
;
Wang, Ying
;
Li, Huawei
;
Li, Xiaowei
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2022/12/07
CNTFETs
Delays
Transistors
Layout
Very large scale integration
Radio frequency
Energy consumption
nanotube field-effect transistor (CNFET)
last-level cache (LLC)
process variation (PV)
variation-aware cache
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:
Xu, Dawen
;
Zhu, Ziyang
;
Liu, Cheng
;
Wang, Ying
;
Zhao, Shuang
;
Zhang, Lei
;
Liang, Huaguo
;
Li, Huawei
;
Cheng, Kwang-Ting
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2021/12/01
Neural networks
Circuit faults
Hardware
Acceleration
Reliability
Analytical models
Computational modeling
Integrated circuit reliability
reliability
An Adaptive Thermal-Aware ECC Scheme for Reliable STT-MRAM LLC Design
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 8, 页码: 1851-1860
作者:
Wu, Bi
;
Zhang, Beibei
;
Cheng, Yuanqing
;
Wang, Ying
;
Liu, Dijun
;
Zhao, Weisheng
收藏
  |  
浏览/下载:81/0
  |  
提交时间:2019/12/10
Error correction code (ECC)
last level cache (LLC)
reliability
spin-transfer-torque magnetoresistive random-access memory (STT-MRAM)
temperature
Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 1, 页码: 159-172
作者:
Yin, Xunzhao
;
Chen, Xiaoming
;
Niemier, Michael
;
Hu, Xiaobo Sharon
收藏
  |  
浏览/下载:85/0
  |  
提交时间:2019/04/03
Ferroelectric FET (FeFET)
logic-in-memory (LiM)
nonvolatile (NV) memory
The Cat and Mouse in Split Manufacturing
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 卷号: 26, 期号: 5, 页码: 805-817
作者:
Wang, Yujie
;
Chen, Pu
;
Hu, Jiang
;
Li, Guofeng
;
Rajendran, Jeyavijayan
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2019/12/10
Hardware security
placement perturbation
split manufacturing