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In-Memory Wallace Tree Multipliers Based on Majority Gates Within Voltage-Gated SOT-MRAM Crossbar Arrays 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 8
作者:  Hui, Yajuan;  Li, Qingzhen;  Wang, Leimin;  Liu, Cheng;  Zhang, Deming;  Miao, Xiangshui
收藏  |  浏览/下载：4/0  |  提交时间：2024/05/20
In-memory computing  majority gates  voltage-gated SOT-MRAM  Wallace tree multiplier  
Exploring Winograd Convolution for Cost-Effective Neural Network Fault Tolerance 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 11, 页码: 1763-1773
作者:  Xue, Xinghua;  Liu, Cheng;  Liu, Bo;  Huang, Haitong;  Wang, Ying;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Fault tolerant systems  Fault tolerance  Artificial neural networks  Convolution  Reliability  Computational modeling  Neurons  Fault-tolerance  soft errors  vulnerability analysis  winograd convolution (WG-Conv)  
Soft Error Reliability Analysis of Vision Transformers 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11
作者:  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Yang, Bing;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
ABFT  fault-tolerance  soft errors  vision transformers (ViTs)  vulnerability analysis  
BitXpro: Regularity-Aware Hardware Runtime Pruning for Deep Neural Networks 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 1, 页码: 90-103
作者:  Li, Hongyan;  Lu, Hang;  Wang, Haoxuan;  Deng, Shengji;  Li, Xiaowei
收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12
Deep learning accelerator  deep neural network (DNN)  hardware runtime pruning  
Taming Process Variations in CNFET for Efficient Last-Level Cache Design 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022, 卷号: 30, 期号: 4, 页码: 418-431
作者:  Xu, Dawen;  Feng, Zhuangyu;  Liu, Cheng;  Li, Li;  Wang, Ying;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：26/0  |  提交时间：2022/12/07
CNTFETs  Delays  Transistors  Layout  Very large scale integration  Radio frequency  Energy consumption  nanotube field-effect transistor (CNFET)  last-level cache (LLC)  process variation (PV)  variation-aware cache  
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting
收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01
Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability  
The Cat and Mouse in Split Manufacturing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 卷号: 26, 期号: 5, 页码: 805-817
作者:  Wang, Yujie;  Chen, Pu;  Hu, Jiang;  Li, Guofeng;  Rajendran, Jeyavijayan
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/10
Hardware security  placement perturbation  split manufacturing  
Resilience-Aware Frequency Tuning for Neural-Network-Based Approximate Computing Chips 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 10, 页码: 2736-2748
作者:  Wang, Ying;  Deng, Jiachao;  Fang, Yuntan;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/12
Deep learning  error tolerance  neural network (NN)  timing variation  
STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296
作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12
Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)  
PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/13
3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput