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Parallel Static Learning Toward Heterogeneous Computing Architectures 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2024, 卷号: 43, 期号: 3, 页码: 983-993
作者:  Lin, Xiaoze;  Lai, Liyang;  Li, Huawei
收藏  |  浏览/下载:1/0  |  提交时间:2024/12/06
Automatic test pattern generation (ATPG)  graphics processing unit (GPU)  multicore CPU  parallel acceleration  static learning  
HTDet: A Clustering Method Using Information Entropy for Hardware Trojan Detection 期刊论文
TSINGHUA SCIENCE AND TECHNOLOGY, 2021, 卷号: 26, 期号: 1, 页码: 48-61
作者:  Lu, Renjie;  Shen, Haihua;  Feng, Zhihua;  Li, Huawei;  Zhao, Wei;  Li, Xiaowei
收藏  |  浏览/下载:44/0  |  提交时间:2021/12/01
Hardware Trojan (HT) detection  information entropy  Density-Based Spatial Clustering of Applications with Noise (DBSCAN)  unsupervised learning  clustering  mutual information  test patterns generation  
Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2016, 卷号: 35, 期号: 6, 页码: 999-1011
作者:  Zhou, Yanhong;  Wang, Tiancheng;  Li, Huawei;  Lv, Tao;  Li, Xiaowei
收藏  |  浏览/下载:72/0  |  提交时间:2019/12/13
Abstraction-guided simulation  functional test generation  hard-to-reach states  path constraint solving  
Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982
作者:  Zhang, Minjin;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:78/0  |  提交时间:2019/12/16
Crosstalk-induced delay  delay testing  path delay fault  signal integrity  test generation  timing analysis  
Automatic string test data generation for detecting domain errors 期刊论文
SOFTWARE TESTING VERIFICATION & RELIABILITY, 2010, 卷号: 20, 期号: 3, 页码: 209-236
作者:  Zhao, Ruilian;  Lyu, Michael R.;  Min, Yinghua
收藏  |  浏览/下载:43/0  |  提交时间:2019/12/16
domain testing  string predicate  dynamic test data generation  ON-OFF test point  
Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046
作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei
收藏  |  浏览/下载:46/0  |  提交时间:2019/12/16
microprocessor design-for-testability  test generation  built-in self-test  at-speed testing  
无权访问的条目 期刊论文
作者:  Da Wang(王 达);  Yu Hu(胡 瑜);  Hua-Wei Li(李华伟);  Xiao-Wei Li(李晓维)
Adobe PDF(9188Kb)  |  收藏  |  浏览/下载:0/0  |  提交时间:2010/11/02
A framework for automated test generation in intelligent tutoring systems 期刊论文
KNOWLEDGE SCIENCE, ENGINEERING AND MANAGEMENT, 2006, 卷号: 4092, 页码: 392-404
作者:  Tang Suqin;  Cao Cungen
收藏  |  浏览/下载:46/0  |  提交时间:2019/12/16
intelligent tutoring system  test generation  domain conceptual model  testing goal  test-generation rules  individualized testing  
Selection of crosstalk-induced faults in enhanced delay test 期刊论文
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2005, 卷号: 21, 期号: 2, 页码: 181-195
作者:  Li, HW;  Li, XW
收藏  |  浏览/下载:46/0  |  提交时间:2019/12/16
delay test  crosstalk  automatic test pattern generation (ATPG)  critical paths  
A novel RTL behavioral description based ATPG method 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2003, 卷号: 18, 期号: 3, 页码: 308-317
作者:  Yin, ZG;  Min, YH;  Li, XW;  Li, HW
收藏  |  浏览/下载:74/0  |  提交时间:2019/12/16
RTL (Register Transfer Level)  ATPG (Automatic Test Pattern Generation)  behavioral description  HDL (Hardware Description Language)