Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving

doi:10.1109/TCAD.2015.2481863

	Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving
	Zhou, Yanhong 1,2; Wang, Tiancheng 1,2; Li, Huawei 1; Lv, Tao 1; Li, Xiaowei 1
	2016-06-01
发表期刊	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
ISSN	0278-0070
卷号	35 期号:6 页码:999-1011
摘要	Test generation for hard-to-reach states is important in functional verification. In this paper, we present a path constraint solving-based test generation method (PACOST) which operates in an abstraction-guided semiformal verification framework to cover hard-to-reach states. PACOST combines concrete simulation and symbolic simulation on the design under verification for path constraint extraction and mutation, and uses a sequential path constraint extractor to generate a set of valid input vectors for exploring different simulation paths with different next states. It then works on a target state-oriented abstract model to select the next state with the smallest abstract distance. In addition, the value of register variables in control logic can be controlled by analyzing the data dependence between variables, which helps the simulation converge to the target states. Experimental results show that PACOST can generate shorter traces reaching hard-to-reach states, in comparison with previous abstraction-guided semiformal methods.
关键词	Abstraction-guided simulation functional test generation hard-to-reach states path constraint solving
DOI	10.1109/TCAD.2015.2481863
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61176040] ; National Natural Science Foundation of China[61221062] ; National Basic Research Program of China (973)[2011CB302501]
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Interdisciplinary Applications ; Engineering, Electrical & Electronic
WOS记录号	WOS:000377105700010
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计	被引频次：7[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/8401
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, Huawei
作者单位	1.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Zhou, Yanhong,Wang, Tiancheng,Li, Huawei,et al. Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2016,35(6):999-1011.
APA	Zhou, Yanhong,Wang, Tiancheng,Li, Huawei,Lv, Tao,&Li, Xiaowei.(2016).Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,35(6),999-1011.
MLA	Zhou, Yanhong,et al."Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 35.6(2016):999-1011.