Selection of crosstalk-induced faults in enhanced delay test

	Selection of crosstalk-induced faults in enhanced delay test
	Li, HW; Li, XW
	2005-04-01
发表期刊	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN	0923-8174
卷号	21 期号:2 页码:181-195
摘要	Current design trends have shown that crosstalk issues in deep sub-micron can cause severe design validation and test problems. In this paper, we address the problem of enhanced delay test considering crosstalk-induced effects. Two types of crosstalk-induced delay fault model in related works are analyzed according to their relationship to common delay fault models. The difficulties in test generation using these fault models are shown. Based on the discussion, a single precise crosstalk-induced path delay fault model, S-PCPDF model, is proposed for circuits given delay assignment. A target S-PCPDF fault gives information on a sub-path to be sensitized to generate necessary transitions coupled to a critical path. It is then convenient to enhance conventional path delay fault ATPG algorithms to implement ATPG systems for crosstalk-induced path delay faults by adding the constraints on the sub-path. We then propose two approaches to reducing the number of target S-PCPDF faults. One is based on constraints for side-inputs of paths under test. The other is based on pre-specified states during test generation for the critical path. Experimental results on ISCAS'89 benchmark circuits showed that the proposed approaches can reduce the number of target faults significantly and efficiently. The CPU time for fault list reduction and test pattern generation is acceptable for circuits of reasonable sizes.
关键词	delay test crosstalk automatic test pattern generation (ATPG) critical paths
收录类别	SCI
语种	英语
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000227948300008
出版者	SPRINGER
引用统计	被引频次：6[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/10106
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, HW
作者单位	Chinese Acad Sci, Inst Comp Technol, Beijing, Peoples R China
推荐引用方式 GB/T 7714	Li, HW,Li, XW. Selection of crosstalk-induced faults in enhanced delay test[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,2005,21(2):181-195.
APA	Li, HW,&Li, XW.(2005).Selection of crosstalk-induced faults in enhanced delay test.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,21(2),181-195.
MLA	Li, HW,et al."Selection of crosstalk-induced faults in enhanced delay test".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 21.2(2005):181-195.