Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor

doi:10.1007/s11390-008-9193-0

	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor
	Wang, Da 1,2; Hu, Yu 1; Li, Hua-Wei 1; Li, Xiao-Wei 1
	2008-11-01
发表期刊	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
ISSN	1000-9000
卷号	23 期号:6 页码:1037-1046
摘要	This paper describes the design-for-testability (DFT) features and low-cost testing solutions of a general purpose microprocessor. The optimized DFT features are presented in detail. A hybrid scan compression structure was executed and achieved compression ratio more than ten times. Memory built-in self-test (BIST) circuitries were designed with scan collars instead of bitmaps to reduce area overheads and to improve test and debug efficiency. The implemented DFT framework also utilized internal phase-locked loops (PLL) to provide complex at-speed test clock sequences. Since there are still limitations in this DFT design, the test strategies for this case are quite complex, with complicated automatic test pattern generation (ATPG) and debugging flow. The sample testing results are given in the paper. All the DFT methods discussed in the paper are prototypes for a high-volume manufacturing (HVM) DFT plan to meet high quality test goals as well as slow test power consumption and cost.
关键词	microprocessor design-for-testability test generation built-in self-test at-speed testing
DOI	10.1007/s11390-008-9193-0
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[60633060] ; National Natural Science Foundation of China[60606008] ; National Natural Science Foundation of China[60776031] ; National Natural Science Foundation of China[60803031] ; National Natural Science Foundation of China[90607010] ; National Basic Research 973 Program of China[2005CB321604] ; National Basic Research 973 Program of China[2005CB321605] ; National High Technology Research and Development 863 Program of China[2007AA01Z107] ; National High Technology Research and Development 863 Program of China[2007AA01Z113] ; National High Technology Research and Development 863 Program of China[2007AA01Z476]
WOS研究方向	Computer Science
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
WOS记录号	WOS:000261179300013
出版者	SCIENCE PRESS
引用统计	被引频次：5[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/11405
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, Xiao-Wei
作者单位	1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Wang, Da,Hu, Yu,Li, Hua-Wei,et al. Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2008,23(6):1037-1046.
APA	Wang, Da,Hu, Yu,Li, Hua-Wei,&Li, Xiao-Wei.(2008).Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,23(6),1037-1046.
MLA	Wang, Da,et al."Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 23.6(2008):1037-1046.