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MRFI: An Open-Source Multiresolution Fault Injection Framework for Neural Network Processing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 11
作者:  Huang, Haitong;  Liu, Cheng;  Xue, Xinghua;  Liu, Bo;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Biological neural networks  Hardware  Reliability  Computational modeling  Neural networks  Fault tolerant systems  Fault tolerance  Fault evaluation  fault injection  fault simulation  multiresolution  neural network reliability  
In-Memory Wallace Tree Multipliers Based on Majority Gates Within Voltage-Gated SOT-MRAM Crossbar Arrays 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 8
作者:  Hui, Yajuan;  Li, Qingzhen;  Wang, Leimin;  Liu, Cheng;  Zhang, Deming;  Miao, Xiangshui
收藏  |  浏览/下载：4/0  |  提交时间：2024/05/20
In-memory computing  majority gates  voltage-gated SOT-MRAM  Wallace tree multiplier  
Exploring Winograd Convolution for Cost-Effective Neural Network Fault Tolerance 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 11, 页码: 1763-1773
作者:  Xue, Xinghua;  Liu, Cheng;  Liu, Bo;  Huang, Haitong;  Wang, Ying;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Fault tolerant systems  Fault tolerance  Artificial neural networks  Convolution  Reliability  Computational modeling  Neurons  Fault-tolerance  soft errors  vulnerability analysis  winograd convolution (WG-Conv)  
Soft Error Reliability Analysis of Vision Transformers 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11
作者:  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Yang, Bing;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
ABFT  fault-tolerance  soft errors  vision transformers (ViTs)  vulnerability analysis  
BitXpro: Regularity-Aware Hardware Runtime Pruning for Deep Neural Networks 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 1, 页码: 90-103
作者:  Li, Hongyan;  Lu, Hang;  Wang, Haoxuan;  Deng, Shengji;  Li, Xiaowei
收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12
Deep learning accelerator  deep neural network (DNN)  hardware runtime pruning  
Taming Process Variations in CNFET for Efficient Last-Level Cache Design 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022, 卷号: 30, 期号: 4, 页码: 418-431
作者:  Xu, Dawen;  Feng, Zhuangyu;  Liu, Cheng;  Li, Li;  Wang, Ying;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：25/0  |  提交时间：2022/12/07
CNTFETs  Delays  Transistors  Layout  Very large scale integration  Radio frequency  Energy consumption  nanotube field-effect transistor (CNFET)  last-level cache (LLC)  process variation (PV)  variation-aware cache  
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting
收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01
Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability  
An Adaptive Thermal-Aware ECC Scheme for Reliable STT-MRAM LLC Design 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 8, 页码: 1851-1860
作者:  Wu, Bi;  Zhang, Beibei;  Cheng, Yuanqing;  Wang, Ying;  Liu, Dijun;  Zhao, Weisheng
收藏  |  浏览/下载：77/0  |  提交时间：2019/12/10
Error correction code (ECC)  last level cache (LLC)  reliability  spin-transfer-torque magnetoresistive random-access memory (STT-MRAM)  temperature  
Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 1, 页码: 159-172
作者:  Yin, Xunzhao;  Chen, Xiaoming;  Niemier, Michael;  Hu, Xiaobo Sharon
收藏  |  浏览/下载：81/0  |  提交时间：2019/04/03
Ferroelectric FET (FeFET)  logic-in-memory (LiM)  nonvolatile (NV) memory  
The Cat and Mouse in Split Manufacturing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 卷号: 26, 期号: 5, 页码: 805-817
作者:  Wang, Yujie;  Chen, Pu;  Hu, Jiang;  Li, Guofeng;  Rajendran, Jeyavijayan
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/10
Hardware security  placement perturbation  split manufacturing