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Soft Error Reliability Analysis of Vision Transformers 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11
作者:  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Yang, Bing;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
ABFT  fault-tolerance  soft errors  vision transformers (ViTs)  vulnerability analysis  
Variation Enhanced Attacks Against RRAM-Based Neuromorphic Computing System 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1588-1596
作者:  Lv, Hao;  Li, Bing;  Zhang, Lei;  Liu, Cheng;  Wang, Ying
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
Security  Hardware  Neuromorphic engineering  Computational modeling  Circuit faults  Resistance  Immune system  Adversarial attack  fault injection attack  neuromorphic computing system (NCS)  processing in memory  reliability  resistive memory  
On-Line Fault Protection for ReRAM-Based Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2023, 卷号: 72, 期号: 2, 页码: 423-437
作者:  Li, Wen;  Wang, Ying;  Liu, Cheng;  He, Yintao;  Liu, Lian;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：14/0  |  提交时间：2023/07/12
Training  Fault detection  Computational modeling  Image edge detection  Memristors  Neural networks  Kernel  Deep neural network  hard fault  ReRAM  reliability  soft fault  
HyCA: A Hybrid Computing Architecture for Fault-Tolerant Deep Learning 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 10, 页码: 3400-3413
作者:  Liu, Cheng;  Chu, Cheng;  Xu, Dawen;  Wang, Ying;  Wang, Qianlong;  Li, Huawei;  Li, Xiaowei;  Cheng, Kwang-Ting
收藏  |  浏览/下载：26/0  |  提交时间：2022/12/07
Circuit faults  Computational modeling  Deep learning  Hardware  Redundancy  Neural networks  Computer architecture  Deep learning accelerator (DLA)  fault detection  fault tolerance  hybrid computing architecture (HyCA)  
Enhancing the security of memory in cloud infrastructure through in-phase change memory data randomisation 期刊论文
IET COMPUTERS AND DIGITAL TECHNIQUES, 2021, 页码: 14
作者:  Zhou, Xianzhong;  Wang, Ying
收藏  |  浏览/下载：27/0  |  提交时间：2021/12/01
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting
收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01
Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability  
A NAND-SPIN-Based Magnetic ADC 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2021, 卷号: 68, 期号: 2, 页码: 617-621
作者:  Wu, Bi;  Wang, Zhaohao;  Li, Yuxuan;  Wang, Ying;  Liu, Dijun;  Zhao, Weisheng;  Hu, Xiaobo Sharon
收藏  |  浏览/下载：37/0  |  提交时间：2021/12/01
Switches  Resistance  Reliability  Magnetic tunneling  Tunneling magnetoresistance  Sensors  Magnetic devices  Magnetic ADC  NAND-SPIN  multiple switching thresholds  
Field-Free 3T2SOT MRAM for Non-Volatile Cache Memories 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 卷号: 67, 期号: 12, 页码: 4660-4669
作者:  Wu, Bi;  Wang, Chao;  Wang, Zhaohao;  Wang, Ying;  Zhang, Deming;  Liu, Dijun;  Zhang, Youguang;  Hu, Xiaobo Sharon
收藏  |  浏览/下载：37/0  |  提交时间：2021/12/01
Random access memory  Magnetic tunneling  Switches  Reliability  Tunneling magnetoresistance  Metals  Transistors  SOT-MRAM  low power  high speed  high reliability  
An Adaptive Thermal-Aware ECC Scheme for Reliable STT-MRAM LLC Design 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 8, 页码: 1851-1860
作者:  Wu, Bi;  Zhang, Beibei;  Cheng, Yuanqing;  Wang, Ying;  Liu, Dijun;  Zhao, Weisheng
收藏  |  浏览/下载：77/0  |  提交时间：2019/12/10
Error correction code (ECC)  last level cache (LLC)  reliability  spin-transfer-torque magnetoresistive random-access memory (STT-MRAM)  temperature  
Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2018, 卷号: 61, 期号: 11, 页码: 17
作者:  Li, Xiaowei;  Yan, Guihai;  Ye, Jing;  Wang, Ying
收藏  |  浏览/下载：69/0  |  提交时间：2019/12/10
fault tolerance  on-chip  self-test  self-diagnosis  self-repair