Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach

doi:10.1007/s11432-017-9290-4

	Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach
	Li, Xiaowei 1,2; Yan, Guihai 1,2; Ye, Jing 1; Wang, Ying 1
	2018-11-01
发表期刊	SCIENCE CHINA-INFORMATION SCIENCES
ISSN	1674-733X
卷号	61 期号:11 页码:17
摘要	If your computer crashes, you can revive it by a reboot, an empirical solution that usually turns out to be effective. The rationale behind this solution is that transient faults, either in hardware or software, can be fixed by refreshing the machine state. Such a "silver bullet", however, could be futile in the future because the faults, especially those existing in the hardware such as Integrated Circuit (IC) chips, cannot be eliminated by refreshing. What we need is a more sophisticated mechanism to steer the system back to the right track. The "magic cure" is the Fault Tolerance On-Chip (FTOC) mechanism, which relies on a suite of built-in design-for-reliability logic, including fault detection, fault diagnosis, and error recovery, working in a self-supportive manner. We have exploited the FTOC to build a holistic solution ranging from on-chip fault detection to error recovery mechanisms to address faults caused by chips progressively aging. Besides fault detection, the FTOC paradigm provides attractive benefits, such as facilitating graceful performance degradation, mitigating the impact of verification blind spots, and improving the chip yield.
关键词	fault tolerance on-chip self-test self-diagnosis self-repair
DOI	10.1007/s11432-017-9290-4
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[61532017] ; National Natural Science Foundation of China[61572470] ; National Natural Science Foundation of China[61521092] ; National Natural Science Foundation of China[61522406] ; National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61376043] ; Youth Innovation Promotion Association, CAS[Y404441000]
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Information Systems ; Engineering, Electrical & Electronic
WOS记录号	WOS:000436197800002
出版者	SCIENCE PRESS
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/5150
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Yan, Guihai
作者单位	1.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Li, Xiaowei,Yan, Guihai,Ye, Jing,et al. Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach[J]. SCIENCE CHINA-INFORMATION SCIENCES,2018,61(11):17.
APA	Li, Xiaowei,Yan, Guihai,Ye, Jing,&Wang, Ying.(2018).Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach.SCIENCE CHINA-INFORMATION SCIENCES,61(11),17.
MLA	Li, Xiaowei,et al."Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach".SCIENCE CHINA-INFORMATION SCIENCES 61.11(2018):17.