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A Coordinated Model Pruning and Mapping Framework for RRAM-Based DNN Accelerators 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 7, 页码: 2364-2376
作者:  Qu, Songyun;  Li, Bing;  Zhao, Shixin;  Zhang, Lei;  Wang, Ying
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
AutoML  bit-pruning  deep neural networks (DNNs)  resistive random access memory (RRAM)  
Network Pruning for Bit-Serial Accelerators 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1597-1609
作者:  Zhao, Xiandong;  Wang, Ying;  Liu, Cheng;  Shi, Cong;  Tu, Kaijie;  Zhang, Lei
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
AI accelerators  neural networks (NNs)  NN compression  
On-Line Fault Protection for ReRAM-Based Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2023, 卷号: 72, 期号: 2, 页码: 423-437
作者:  Li, Wen;  Wang, Ying;  Liu, Cheng;  He, Yintao;  Liu, Lian;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：14/0  |  提交时间：2023/07/12
Training  Fault detection  Computational modeling  Image edge detection  Memristors  Neural networks  Kernel  Deep neural network  hard fault  ReRAM  reliability  soft fault  
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting
收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01
Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability  
A NAND-SPIN-Based Magnetic ADC 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2021, 卷号: 68, 期号: 2, 页码: 617-621
作者:  Wu, Bi;  Wang, Zhaohao;  Li, Yuxuan;  Wang, Ying;  Liu, Dijun;  Zhao, Weisheng;  Hu, Xiaobo Sharon
收藏  |  浏览/下载：37/0  |  提交时间：2021/12/01
Switches  Resistance  Reliability  Magnetic tunneling  Tunneling magnetoresistance  Sensors  Magnetic devices  Magnetic ADC  NAND-SPIN  multiple switching thresholds  
Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2018, 卷号: 61, 期号: 11, 页码: 17
作者:  Li, Xiaowei;  Yan, Guihai;  Ye, Jing;  Wang, Ying
收藏  |  浏览/下载：69/0  |  提交时间：2019/12/10
fault tolerance  on-chip  self-test  self-diagnosis  self-repair  
Power-Utility-Driven Write Management for MLC PCM 期刊论文
ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS, 2017, 卷号: 13, 期号: 3, 页码: 22
作者:  Li, Bing;  Hu, Yu;  Wang, Ying;  Ye, Jing;  Li, Xiaowei
收藏  |  浏览/下载：54/0  |  提交时间：2019/12/12
Phase change memory  multi-level  main memory  power  write management  optimization  
Enhanced Wear-Rate Leveling for PRAM Lifetime Improvement Considering Process Variation 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 1, 页码: 92-102
作者:  Han, Yinhe;  Dong, Jianbo;  Weng, Kaiheng;  Wang, Ying;  Li, Xiaowei
收藏  |  浏览/下载：42/0  |  提交时间：2019/12/13
Endurance  phase-change random access memory (PRAM)  wear leveling (WL)  
Data Remapping for Static NUCA in Degradable Chip Multiprocessors 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2015, 卷号: 23, 期号: 5, 页码: 879-892
作者:  Wang, Ying;  Zhang, Lei;  Han, Yin-He;  Li, Hua-Wei;  Li, Xiaowei
收藏  |  浏览/下载：37/0  |  提交时间：2019/12/13
Chip multiprocessor (CMP)  fault tolerant  network-on-chip (NoC)  nonuniform cache architecture (NUCA)  
A signal degradation reduction method for memristor ratioed logic (MRL) gates 期刊论文
IEICE ELECTRONICS EXPRESS, 2015, 卷号: 12, 期号: 8, 页码: 6
作者:  Liu, Bosheng l;  Wang, Ying;  You, Zhiqiang;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载：39/0  |  提交时间：2019/12/13
full adder  memristor ratioed logic (MRL) gate