中国科学院计算技术研究所机构知识库

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已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	Functional Verification for Agile Processor Development: A Case for Workflow Integration 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2023, 卷号: 38, 期号: 4, 页码: 737-753 作者:  Xu, Yi-Nan;  Yu, Zi-Hao;  Wang, Kai-Fan;  Wang, Hua-Qiang;  Lin, Jia-Wei;  Jin, Yue;  Zhang, Lin-Juan;  Zhang, Zi-Fei;  Tang, Dan;  Wang, Sa;  Shi, Kan;  Sun, Ning-Hui;  Bao, Yun-Gang 收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20 functional verification  agile development  open-source hardware  workflow integration
	Parallel Software-Based Self-Testing with Bounded Model Checking for Kilo-Core Networks-on-Chip 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2023, 卷号: 38, 期号: 2, 页码: 405-421 作者:  Zhang, Ying;  Ji, Peng-Fei;  Zhu, Pan-Wei;  Peng, Zebo;  Li, Hua-Wei;  Jiang, Jian-Hui 收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04 software-based self-testing (SBST)  parallel test  kilo-core networks-on-chip (NoCs)  online testing
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui 收藏  |  浏览/下载：51/0  |  提交时间：2020/12/10 Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)
	Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2016, 卷号: 35, 期号: 6, 页码: 999-1011 作者:  Zhou, Yanhong;  Wang, Tiancheng;  Li, Huawei;  Lv, Tao;  Li, Xiaowei 收藏  |  浏览/下载：65/0  |  提交时间：2019/12/13 Abstraction-guided simulation  functional test generation  hard-to-reach states  path constraint solving
	Clustering of behavioral phases in FSMs and its applications to VLSI test 期刊论文 SCIENCE IN CHINA SERIES F, 2002, 卷号: 45, 期号: 6, 页码: 462-478 作者:  Li, HW;  Min, YH;  Li, ZC 收藏  |  浏览/下载：72/0  |  提交时间：2019/12/16 finite-state machines  clustering of states  behavioral descriptions  test generation