Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors

doi:10.1109/TCAD.2018.2890695

	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors
	Zhang, Ying 1; Chakrabarty, Krishnendu 2; Peng, Zebo 3; Rezine, Ahmed 3; Li, Huawei 4; Eles, Petru 3; Jiang, Jianhui 1
	2020-03-01
发表期刊	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
ISSN	0278-0070
卷号	39 期号:3 页码:714-727
摘要	Generating functional tests for processors has been a challenging problem for decades in the very large-scale integration testing field. This paper presents a method that generates software-based self-tests by leveraging bounded model checking (BMC) techniques and targeting, for the first time, out-of-order [out-of-order execution (OOE)] superscalar processors. To combat the state-space explosion associated with BMC, the proposed method starts by combining module-level abstraction-refinement with slicing to reduce the size of the model under verification. Next, an off-the-shelf BMC solver is used on the obtained extended finite-state machines to generate the leading sequences that are necessary to excite internal processor functions. Finally, constrained automatic test-pattern generation is used to cover all structural faults within every function excited by the obtained leading sequences. Experimental results show that the proposed method leads to extremely high fault coverage on the critical components corresponding to OOE operations in functional mode. The method therefore helps in tackling the over-testing problem that is inherent to the full-scan test approach.
关键词	Circuit faults Built-in self-test Out of order Model checking Integrated circuit modeling Bounded model checking (BMC) online testing out-of-order superscalar processors software-based self-testing (SBST)
DOI	10.1109/TCAD.2018.2890695
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61404092] ; National Natural Science Foundation of China[61876173] ; Fundamental Research Funds for the Central Universities ; Duke University
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Interdisciplinary Applications ; Engineering, Electrical & Electronic
WOS记录号	WOS:000520102700014
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计	被引频次：8[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/14096
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Zhang, Ying
作者单位	1.Tongji Univ, Shanghai 201804, Peoples R China 2.Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA 3.Linkoeping Univ, Linkoping, Sweden 4.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Zhang, Ying,Chakrabarty, Krishnendu,Peng, Zebo,et al. Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2020,39(3):714-727.
APA	Zhang, Ying.,Chakrabarty, Krishnendu.,Peng, Zebo.,Rezine, Ahmed.,Li, Huawei.,...&Jiang, Jianhui.(2020).Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,39(3),714-727.
MLA	Zhang, Ying,et al."Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 39.3(2020):714-727.