Clustering of behavioral phases in FSMs and its applications to VLSI test

	Clustering of behavioral phases in FSMs and its applications to VLSI test
	Li, HW; Min, YH; Li, ZC
	2002-12-01
发表期刊	SCIENCE IN CHINA SERIES F
ISSN	1009-2757
卷号	45 期号:6 页码:462-478
摘要	This paper presents a new level of description between behavioral and state descriptions of a finite-state machine (FSM). The description is termed behavioral phase clustering description. New concepts of behavioral phase and clustering of behavioral phases in an FSM are introduced. The new description simplifies functional analysis, verification and test of FSM designs. If an FSM is described at low level, some states can be clustered into behavioral phases directly. If it is described at behavioral level, behavioral phases can be extracted from the behavioral description, and clustering of behavioral phases can be performed through easy functional analysis. As one application of behavioral phase clustering descriptions, a new technique employed in a test generation system, ATCLUB, at Register Transfer (RT)-level based on a behavioral phase transition fault model is introduced in this paper. In ATCLUB, test generation process is accelerated through clustering of behavioral phases. Experimental results show that ATCLUB generates test sequence efficiently, with a sharp decrease in vector count at the penalty of a slightly decrease in fault coverage comparing to other ATPG tools.
关键词	finite-state machines clustering of states behavioral descriptions test generation
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Information Systems
WOS记录号	WOS:000179596300006
出版者	SCIENCE CHINA PRESS
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13496
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, HW
作者单位	Chinese Acad Sci, Inst Comp Technol, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Li, HW,Min, YH,Li, ZC. Clustering of behavioral phases in FSMs and its applications to VLSI test[J]. SCIENCE IN CHINA SERIES F,2002,45(6):462-478.
APA	Li, HW,Min, YH,&Li, ZC.(2002).Clustering of behavioral phases in FSMs and its applications to VLSI test.SCIENCE IN CHINA SERIES F,45(6),462-478.
MLA	Li, HW,et al."Clustering of behavioral phases in FSMs and its applications to VLSI test".SCIENCE IN CHINA SERIES F 45.6(2002):462-478.