中国科学院计算技术研究所机构知识库

浏览/检索结果: 共7条，第1-7条

帮助

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序WOS被引频次升序WOS被引频次降序提交时间升序提交时间降序期刊影响因子升序期刊影响因子降序题名升序题名降序发表日期升序发表日期降序
	Parallel Software-Based Self-Testing with Bounded Model Checking for Kilo-Core Networks-on-Chip 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2023, 卷号: 38, 期号: 2, 页码: 405-421 作者:  Zhang, Ying;  Ji, Peng-Fei;  Zhu, Pan-Wei;  Peng, Zebo;  Li, Hua-Wei;  Jiang, Jian-Hui 收藏  |  浏览/下载：22/0  |  提交时间：2023/12/04 software-based self-testing (SBST)  parallel test  kilo-core networks-on-chip (NoCs)  online testing
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui 收藏  |  浏览/下载：60/0  |  提交时间：2020/12/10 Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)
	Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2018, 卷号: 61, 期号: 11, 页码: 17 作者:  Li, Xiaowei;  Yan, Guihai;  Ye, Jing;  Wang, Ying 收藏  |  浏览/下载：77/0  |  提交时间：2019/12/10 fault tolerance  on-chip  self-test  self-diagnosis  self-repair
	Fault tolerance on-chip:a reliable computing paradigm using self-test,self-diagnosis,and self-repair (3S)approach 期刊论文 中国科学:信息科学(英文版), 2018, 卷号: 61.0, 期号: 011, 页码: 112102 作者:  Xiaowei LI;  Guihai YAN;  Jing YE;  Ying WANG 收藏  |  浏览/下载：14/0  |  提交时间：2023/12/04 fault  tolerance  on-chip  self-test  self-diagnosis  self-repair
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：46/0  |  提交时间：2019/12/16 microprocessor design-for-testability  test generation  built-in self-test  at-speed testing
	无权访问的条目 期刊论文 作者:  Da Wang(王 达);  Yu Hu(胡 瑜);  Hua-Wei Li(李华伟);  Xiao-Wei Li(李晓维) Adobe PDF(9188Kb)  |  收藏  |  浏览/下载：0/0  |  提交时间：2010/11/02
	A loop-based apparatus for at-speed self-testing 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2001, 卷号: 16, 期号: 3, 页码: 278-285 作者:  Li, XW;  Cheung, PYS 收藏  |  浏览/下载：78/0  |  提交时间：2019/12/16 built-in self-test  at-speed test  multiple input shift register  state transition graph