A loop-based apparatus for at-speed self-testing

	A loop-based apparatus for at-speed self-testing
	Li, XW ; Cheung, PYS
	2001-05-01
发表期刊	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
ISSN	1000-9000
卷号	16 期号:3 页码:278-285
摘要	At-speed testing using external tester requires an expensive equip ment, thus built-in self-test (BIST) is an alternative technique due to its ability to perform on-chip at-speed self-testing. The main issue in BIST for at-speed testing is to obtain high delay fault coverage with a low hardware overhead. This paper presents an improved loop-based BIST scheme, in which a configurable MISR (multiple-input signature register) is used to generate test-pair sequences. The structure and operation modes of the BIST scheme are described. The topological properties of the state-transition-graph of the proposed BIST scheme are analyzed. Based on it, an approach to design and efficiently implement the proposed BIST scheme is developed. Experimental results on academic benchmark circuits are presented to demonstrate the effectiveness of the proposed BIST scheme as well as the design approach.
关键词	built-in self-test at-speed test multiple input shift register state transition graph
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
WOS记录号	WOS:000168732300008
出版者	SCIENCE PRESS
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13436
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, XW
作者单位	1.Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China 2.Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China
推荐引用方式 GB/T 7714	Li, XW,Cheung, PYS. A loop-based apparatus for at-speed self-testing[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2001,16(3):278-285.
APA	Li, XW,&Cheung, PYS.(2001).A loop-based apparatus for at-speed self-testing.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,16(3),278-285.
MLA	Li, XW,et al."A loop-based apparatus for at-speed self-testing".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 16.3(2001):278-285.