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MNSIM 2.0: A Behavior-Level Modeling Tool for Processing-In-Memory Architectures 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 11, 页码: 4112-4125
作者:  Zhu, Zhenhua;  Sun, Hanbo;  Xie, Tongxin;  Zhu, Yu;  Dai, Guohao;  Xia, Lixue;  Niu, Dimin;  Chen, Xiaoming;  Hu, Xiaobo Sharon;  Cao, Yu;  Xie, Yuan;  Yang, Huazhong;  Wang, Yu
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Computational modeling  Computer architecture  Integrated circuit modeling  Scheduling  Hardware  Memristors  Convolutional neural networks  Hardware modeling tool  processing-in-memory (PIM)  software-hardware co-optimization  
Spatial-Temporal Graph Network for Video Crowd Counting 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, 2023, 卷号: 33, 期号: 1, 页码: 228-241
作者:  Wu, Zhe;  Zhang, Xinfeng;  Tian, Geng;  Wang, Yaowei;  Huang, Qingming
收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12
Computational modeling  Predictive models  Analytical models  Long short term memory  Optical flow  Integrated circuit modeling  Head  Video-based crowd counting  spatiotemporal graph attention  multi-scale module  
Modeling and Optimization of Low-Power AND Gates Based on Stochastic Thermodynamics 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2022, 卷号: 69, 期号: 9, 页码: 3729-3733
作者:  Kuang, Jiayue;  Ge, Xiaohu;  Yang, Yang;  Tian, Lin
收藏  |  浏览/下载：21/0  |  提交时间：2022/12/07
Logic gates  Transistors  Energy states  Thermodynamics  Voltage  Energy consumption  Integrated circuit modeling  Stochastic thermodynamics  subthreshold voltage  single-electron transistor  AND gate  order of operations  
Accurate reliability analysis methods for approximate computing circuits 期刊论文
TSINGHUA SCIENCE AND TECHNOLOGY, 2022, 卷号: 27, 期号: 4, 页码: 729-740
作者:  Wang, Zhen;  Zhang, Guofa;  Ye, Jing;  Jiang, Jianhui;  Li, Fengyong;  Wang, Yong
收藏  |  浏览/下载：31/0  |  提交时间：2022/06/21
Reliability  Integrated circuit reliability  Correlation  Probability  Approximate computing  Integrated circuit modeling  Circuit faults  Approximate Computing Circuit (ACC)  correlation coefficient  iterative Probabilistic Transfer Matrix (PTM)  reliability  
Nonlinear Causal Discovery for High-Dimensional Deterministic Data 期刊论文
IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS, 2021, 页码: 12
作者:  Zeng, Yan;  Hao, Zhifeng;  Cai, Ruichu;  Xie, Feng;  Huang, Libo;  Shimizu, Shohei
收藏  |  浏览/下载：24/0  |  提交时间：2022/06/21
Integrated circuit modeling  Data models  Linearity  Kernel  Learning systems  Hilbert space  Covariance matrices  Causal ordering  deterministic relations  high-dimensional data  nonlinear causal discovery  
Practical Attacks on Deep Neural Networks by Memory Trojaning 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2021, 卷号: 40, 期号: 6, 页码: 1230-1243
作者:  Hu, Xing;  Zhao, Yang;  Deng, Lei;  Liang, Ling;  Zuo, Pengfei;  Ye, Jing;  Lin, Yingyan;  Xie, Yuan
收藏  |  浏览/下载：35/0  |  提交时间：2021/12/01
Trojan horses  Hardware  Integrated circuit modeling  Computational modeling  Security  Payloads  Convolutional neural networks (CNNs)  deep learning accelerator  deep learning attack  hardware Trojan  
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting
收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01
Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability  
Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727
作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui
收藏  |  浏览/下载：50/0  |  提交时间：2020/12/10
Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)