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Accurate reliability analysis methods for approximate computing circuits
Wang, Zhen1; Zhang, Guofa1; Ye, Jing2; Jiang, Jianhui3; Li, Fengyong1; Wang, Yong1
2022-08-01
发表期刊TSINGHUA SCIENCE AND TECHNOLOGY
ISSN1007-0214
卷号27期号:4页码:729-740
摘要In recent years, Approximate Computing Circuits (ACCs) have been widely used in applications with intrinsic tolerance to errors. With the increased availability of approximate computing circuit approaches, reliability analysis methods for assessing their fault vulnerability have become highly necessary. In this study, two accurate reliability evaluation methods for approximate computing circuits are proposed. The reliability of approximate computing circuits is calculated on the basis of the iterative Probabilistic Transfer Matrix (PTM) model. During the calculation, the correlation coefficients are derived and combined to deal with the correlation problem caused by fanout reconvergence. The accuracy and scalability of the two methods are verified using three sets of approximate computing circuit instances and more circuits in EvoApprox8b, which is an approximate computing circuit open source library. Experimental results show that relative to the Monte Carlo simulation, the two methods achieve average error rates of 0.46% and 1.29% and time overheads of 0.002% and 0.1%. Different from the existing approaches to reliability estimation for approximate computing circuits based on the original PTM model, the proposed methods reduce the space overheads by nearly 50% and achieve time overheads of 1.78% and 2.19%.
关键词Reliability Integrated circuit reliability Correlation Probability Approximate computing Integrated circuit modeling Circuit faults Approximate Computing Circuit (ACC) correlation coefficient iterative Probabilistic Transfer Matrix (PTM) reliability
DOI10.26599/TST.2020.9010032
收录类别SCI
语种英语
资助项目National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61772327] ; Natural Science Foundation of Shanghai[20ZR1455900] ; Natural Science Foundation of Shanghai[20ZR1421600] ; Qi'anxin National Engineering Laboratory for Big Data Collaborative Security Technology Open Project[QAX-201803] ; State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences[CARCHA202005]
WOS研究方向Computer Science ; Engineering
WOS类目Computer Science, Information Systems ; Computer Science, Software Engineering ; Engineering, Electrical & Electronic
WOS记录号WOS:000728972400009
出版者TSINGHUA UNIV PRESS
引用统计
被引频次:5[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://119.78.100.204/handle/2XEOYT63/18031
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Ye, Jing; Jiang, Jianhui
作者单位1.Shanghai Univ Elect Power, Sch Comp Sci & Technol, Shanghai 200090, Peoples R China
2.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China
3.Tongji Univ, Sch Software Engn, Shanghai 200092, Peoples R China
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Wang, Zhen,Zhang, Guofa,Ye, Jing,et al. Accurate reliability analysis methods for approximate computing circuits[J]. TSINGHUA SCIENCE AND TECHNOLOGY,2022,27(4):729-740.
APA Wang, Zhen,Zhang, Guofa,Ye, Jing,Jiang, Jianhui,Li, Fengyong,&Wang, Yong.(2022).Accurate reliability analysis methods for approximate computing circuits.TSINGHUA SCIENCE AND TECHNOLOGY,27(4),729-740.
MLA Wang, Zhen,et al."Accurate reliability analysis methods for approximate computing circuits".TSINGHUA SCIENCE AND TECHNOLOGY 27.4(2022):729-740.
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