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ApproxDup: Developing an Approximate Instruction Duplication Mechanism for Efficient SDC Detection in GPGPUs 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2024, 卷号: 43, 期号: 4, 页码: 1051-1064
作者:  Wei, Xiaohui;  Jiang, Nan;  Yue, Hengshan;  Wang, Xiaonan;  Zhao, Jianpeng;  Li, Guangli;  Qiu, Meikang
收藏  |  浏览/下载：3/0  |  提交时间：2024/05/20
Instruction sets  Reliability  Resilience  Circuit faults  Registers  Kernel  Graphics processing units  Approximate computing  GPGPUs  instruction duplication  silent data corruptions (SDCs)  soft error  
Statistical Modeling of Soft Error Influence on Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 11, 页码: 4152-4163
作者:  Huang, Haitong;  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Luo, Tao;  Cheng, Long;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Fault analysis  fault simulation  neural network (NN) reliability  statistical fault modeling  
Exploring Winograd Convolution for Cost-Effective Neural Network Fault Tolerance 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 11, 页码: 1763-1773
作者:  Xue, Xinghua;  Liu, Cheng;  Liu, Bo;  Huang, Haitong;  Wang, Ying;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Fault tolerant systems  Fault tolerance  Artificial neural networks  Convolution  Reliability  Computational modeling  Neurons  Fault-tolerance  soft errors  vulnerability analysis  winograd convolution (WG-Conv)  
Functional Verification for Agile Processor Development: A Case for Workflow Integration 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2023, 卷号: 38, 期号: 4, 页码: 737-753
作者:  Xu, Yi-Nan;  Yu, Zi-Hao;  Wang, Kai-Fan;  Wang, Hua-Qiang;  Lin, Jia-Wei;  Jin, Yue;  Zhang, Lin-Juan;  Zhang, Zi-Fei;  Tang, Dan;  Wang, Sa;  Shi, Kan;  Sun, Ning-Hui;  Bao, Yun-Gang
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
functional verification  agile development  open-source hardware  workflow integration  
Parallel Software-Based Self-Testing with Bounded Model Checking for Kilo-Core Networks-on-Chip 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2023, 卷号: 38, 期号: 2, 页码: 405-421
作者:  Zhang, Ying;  Ji, Peng-Fei;  Zhu, Pan-Wei;  Peng, Zebo;  Li, Hua-Wei;  Jiang, Jian-Hui
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
software-based self-testing (SBST)  parallel test  kilo-core networks-on-chip (NoCs)  online testing  
On-Line Fault Protection for ReRAM-Based Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2023, 卷号: 72, 期号: 2, 页码: 423-437
作者:  Li, Wen;  Wang, Ying;  Liu, Cheng;  He, Yintao;  Liu, Lian;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：14/0  |  提交时间：2023/07/12
Training  Fault detection  Computational modeling  Image edge detection  Memristors  Neural networks  Kernel  Deep neural network  hard fault  ReRAM  reliability  soft fault  
DRONE: An Efficient Distributed Subgraph-Centric Framework for Processing Large-Scale Power-law Graphs 期刊论文
IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS, 2023, 卷号: 34, 期号: 2, 页码: 463-474
作者:  Zhang, Shuai;  Jiang, Zite;  Hou, Xingzhong;  Li, Mingyu;  Yuan, Mengting;  You, Haihang
收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12
Fault tolerance  graph partition  large-scale power-law graph  parallel graph computation  subgraph-centric model  
Accurate reliability analysis methods for approximate computing circuits 期刊论文
TSINGHUA SCIENCE AND TECHNOLOGY, 2022, 卷号: 27, 期号: 4, 页码: 729-740
作者:  Wang, Zhen;  Zhang, Guofa;  Ye, Jing;  Jiang, Jianhui;  Li, Fengyong;  Wang, Yong
收藏  |  浏览/下载：31/0  |  提交时间：2022/06/21
Reliability  Integrated circuit reliability  Correlation  Probability  Approximate computing  Integrated circuit modeling  Circuit faults  Approximate Computing Circuit (ACC)  correlation coefficient  iterative Probabilistic Transfer Matrix (PTM)  reliability  
FTT-NAS: Discovering Fault-tolerant Convolutional Neural Architecture 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2021, 卷号: 26, 期号: 6, 页码: 24
作者:  Ning, Xuefei;  Ge, Guangjun;  Li, Wenshuo;  Zhu, Zhenhua;  Zheng, Yin;  Chen, Xiaoming;  Gao, Zhen;  Wang, Yu;  Yang, Huazhong
收藏  |  浏览/下载：18/0  |  提交时间：2022/12/07
Neural architecture search  fault tolerance  neural networks  
Fault Modeling and Efficient Testing of Memristor-Based Memory 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2021, 卷号: 68, 期号: 11, 页码: 4444-4455
作者:  Liu, Peng;  You, Zhiqiang;  Wu, Jigang;  Liu, Bosheng;  Han, Yinhe;  Chakrabarty, Krishnendu
收藏  |  浏览/下载：25/0  |  提交时间：2022/06/21
Electrical defects  fault model  defect-oriented testing  March algorithm  non-volatile memory