中文版 | English

在结果中检索

CSpace

浏览/检索结果: 共17条，第1-10条 帮助

限定条件                            
已选(0)清除 条数/页：   排序方式：
Soft Error Reliability Analysis of Vision Transformers 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11
作者:  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Yang, Bing;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
ABFT  fault-tolerance  soft errors  vision transformers (ViTs)  vulnerability analysis  
BitXpro: Regularity-Aware Hardware Runtime Pruning for Deep Neural Networks 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 1, 页码: 90-103
作者:  Li, Hongyan;  Lu, Hang;  Wang, Haoxuan;  Deng, Shengji;  Li, Xiaowei
收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12
Deep learning accelerator  deep neural network (DNN)  hardware runtime pruning  
Taming Process Variations in CNFET for Efficient Last-Level Cache Design 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022, 卷号: 30, 期号: 4, 页码: 418-431
作者:  Xu, Dawen;  Feng, Zhuangyu;  Liu, Cheng;  Li, Li;  Wang, Ying;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：25/0  |  提交时间：2022/12/07
CNTFETs  Delays  Transistors  Layout  Very large scale integration  Radio frequency  Energy consumption  nanotube field-effect transistor (CNFET)  last-level cache (LLC)  process variation (PV)  variation-aware cache  
LMDet: A "Naturalness" Statistical Method for Hardware Trojan Detection 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 卷号: 26, 期号: 4, 页码: 720-732
作者:  Shen, Haihua;  Tan, Huazhe;  Li, Huawei;  Zhang, Feng;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/10
Hardware Trojan (HT) detection  natural language processing (NLP)  n-gram language model  statistical analysis  
Resilience-Aware Frequency Tuning for Neural-Network-Based Approximate Computing Chips 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 10, 页码: 2736-2748
作者:  Wang, Ying;  Deng, Jiachao;  Fang, Yuntan;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/12
Deep learning  error tolerance  neural network (NN)  timing variation  
Going Cooler With Timing-Constrained TeSHoP: A Temperature Sensing-Based Hotspot-Driven Placement Technique for FPGAs 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 9, 页码: 2525-2537
作者:  Lu, Weina;  Hu, Yu;  Ye, Jing;  Li, Xiaowei
收藏  |  浏览/下载：39/0  |  提交时间：2019/12/12
Computer-aided design flow  field-programmable gate arrays (FPGAs)  hotspot optimization  performance  
STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296
作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12
Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)  
PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/13
3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput  
VANUCA: Enabling Near-Threshold Voltage Operation in Large-Capacity Cache 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 3, 页码: 858-870
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：35/0  |  提交时间：2019/12/13
Cache design  fault tolerant  multi-V-dd  near-threshold voltage (NTV)  nonuniform cache access (NUCA)  
Enhanced Wear-Rate Leveling for PRAM Lifetime Improvement Considering Process Variation 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 1, 页码: 92-102
作者:  Han, Yinhe;  Dong, Jianbo;  Weng, Kaiheng;  Wang, Ying;  Li, Xiaowei
收藏  |  浏览/下载：42/0  |  提交时间：2019/12/13
Endurance  phase-change random access memory (PRAM)  wear leveling (WL)