中国科学院计算技术研究所机构知识库

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发表日期：2020

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	Field-Free 3T2SOT MRAM for Non-Volatile Cache Memories 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 卷号: 67, 期号: 12, 页码: 4660-4669 作者:  Wu, Bi;  Wang, Chao;  Wang, Zhaohao;  Wang, Ying;  Zhang, Deming;  Liu, Dijun;  Zhang, Youguang;  Hu, Xiaobo Sharon 收藏  |  浏览/下载：37/0  |  提交时间：2021/12/01 Random access memory  Magnetic tunneling  Switches  Reliability  Tunneling magnetoresistance  Metals  Transistors  SOT-MRAM  low power  high speed  high reliability
	A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 12, 页码: 4524-4536 作者:  Cui, Aijiao;  Li, Mengyang;  Qu, Gang;  Li, Huawei 收藏  |  浏览/下载：29/0  |  提交时间：2021/12/01 Ciphers  Encryption  Integrated circuits  Side-channel attacks  Testing  Cryptographic hash function  obfuscation logic  scan design  scan-based side-channel attack
	Distributed Self-Clock: A Suitable Architecture for SFQ Circuits 期刊论文 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2020, 卷号: 30, 期号: 7, 页码: 7 作者:  Yang, Jia-Hong;  Tang, Guang-Ming;  Zheng, Xiang-Yu;  Ye, Xiao-Chun;  Fan, Dong-Rui;  Zhang, Zhi-Min;  Sun, Ning-Hui 收藏  |  浏览/下载：393/0  |  提交时间：2020/12/10 Integrated circuit  microprocessors  single flux quantum (SFQ)  timing scheme
	Design of an 8-bit Bit-Parallel RSFQ Microprocessor 期刊论文 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2020, 卷号: 30, 期号: 7, 页码: 6 作者:  Qu, Pei-Yao;  Tang, Guang-Ming;  Yang, Jia-Hong;  Ye, Xiao-Chun;  Fan, Dong-Rui;  Zhang, Zhi-Min;  Sun, Ning-Hui 收藏  |  浏览/下载：29/0  |  提交时间：2021/12/01 Digital circuit  rapid single-flux-quantum (RSFQ)  superconducting microprocessor
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui 收藏  |  浏览/下载：50/0  |  提交时间：2020/12/10 Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)