A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash

doi:10.1109/TCAD.2020.2979458

	A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash
	Cui, Aijiao 1; Li, Mengyang 2; Qu, Gang 3,4; Li, Huawei 5,6,7
	2020-12-01
发表期刊	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
ISSN	0278-0070
卷号	39 期号:12 页码:4524-4536
摘要	Design-for-testability (DfT) techniques have been widely adopted into the integrated circuit (IC) design process to facilitate manufacture testing. The scan-based DfT architecture is a popular DfT feature that provides full testability for the circuit under test. However, this turns into a double-edged sword for some ICs such as cryptographic chips because scan design could be used as a side channel to access the intermediate encryption results, with which the cipher key can be deduced easily. To resist such scan-based side-channel attacks, many countermeasures are proposed to obfuscate the test data in scan chain. Unfortunately, most of the obfuscation logic, due to the performance and resource constraints, cannot be proven to be irreversible and hence suffers a high risk for the correct test data being derived from the obfuscated output. In this article, we propose to utilize the cryptographic hash module for some post-processing of the test responses in order to secure the scan design. Our approach has several clear advantages over existing ones. First, the security is guaranteed based on the preimage resistance of cryptographic hash function and the introduced salt information and data collection scheme. Second, it incurs low overhead because the hash module is normally available on the IC, in particular, those where security is important. Finally, full testability is retained as we are not modifying any test input. We present the implementation of the proposed secure design, report the experimental results, and demonstrate that our approach can resist all known scan-based side-channel attacks with negligible overhead while maintaining the testability and other testing performances.
关键词	Ciphers Encryption Integrated circuits Side-channel attacks Testing Cryptographic hash function obfuscation logic scan design scan-based side-channel attack
DOI	10.1109/TCAD.2020.2979458
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[61672182] ; National Natural Science Foundation of China[61876173] ; National Natural Science Foundation of China[61532017] ; Shenzhen Fundamental Science Research Foundation[JCYJ20190806143203510] ; State Key Laboratory of Computer Architecture (Institute of Computing Technology, Chinese Academy of Sciences)[CARCH201701] ; Air Force Office of Scientific Research Multidisciplinary University Research Initiative (AFOSR MURI)[FA9550-14-1-0351]
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Interdisciplinary Applications ; Engineering, Electrical & Electronic
WOS记录号	WOS:000592111400017
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计	被引频次：15[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/16064
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Cui, Aijiao
作者单位	1.Harbin Inst Technol Shenzhen, Sch Elect & Informat Engn, Shenzhen 518055, Peoples R China 2.Huawei Device Co Ltd, Shenzhen 518129, Peoples R China 3.Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA 4.Univ Maryland, Syst Res Inst, College Pk, MD 20742 USA 5.Chinese Acad Sci, SKLCA, Inst Comp Technol, Beijing 100190, Peoples R China 6.Univ Chinese Acad Sci, Sch Comp Sci & Technol, Beijing 100049, Peoples R China 7.Peng Cheng Lab, Open Source Chip Res Ctr, Shenzhen 518066, Peoples R China
推荐引用方式 GB/T 7714	Cui, Aijiao,Li, Mengyang,Qu, Gang,et al. A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2020,39(12):4524-4536.
APA	Cui, Aijiao,Li, Mengyang,Qu, Gang,&Li, Huawei.(2020).A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,39(12),4524-4536.
MLA	Cui, Aijiao,et al."A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 39.12(2020):4524-4536.