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DOE: database offloading engine for accelerating SQL processing 期刊论文
DISTRIBUTED AND PARALLEL DATABASES, 2023, 页码: 25
作者:  Kong, Hao;  Lu, Wenyan;  Chen, Yan;  Wu, Jingya;  Zhang, Yu;  Yan, Guihai;  Li, Xiaowei
收藏  |  浏览/下载:8/0  |  提交时间:2023/12/04
Database  Hardware  software co-design  Heterogeneous system  Analytic query processing  
BZIP: A compact data memory system for UTXO-based blockchains 期刊论文
JOURNAL OF SYSTEMS ARCHITECTURE, 2020, 卷号: 109, 页码: 8
作者:  Jiang, Shuhao;  Li, Jiajun;  Gong, Shijun;  Yan, Junchao;  Yan, Guihai;  Sun, Yi;  Li, Xiaowei
收藏  |  浏览/下载:49/0  |  提交时间:2020/12/10
UTXO  Blockchain  Data Compression  IoT  
A QoS-QoR Aware CNN Accelerator Design Approach 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2019, 卷号: 38, 期号: 11, 页码: 1995-2007
作者:  Wang, Ying;  Li, Huawei;  Cheng, Long;  Li, Xiaowei
收藏  |  浏览/下载:48/0  |  提交时间:2020/12/10
Approximate computing  convolutional neural network (CNN)  deep learning (DL)  quality of service (QoS)  real-time  
PUFPass: A password management mechanism based on software/hardware codesign 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2019, 卷号: 64, 页码: 173-183
作者:  Guo, Qingli;  Ye, Jing;  Li, Bing;  Hu, Yu;  Li, Xiaowei;  Lan, Yazhu;  Zhang, Guohe
收藏  |  浏览/下载:69/0  |  提交时间:2019/04/03
Password  Password management mechanism  PUF  Security  Usability  
Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2018, 卷号: 61, 期号: 11, 页码: 17
作者:  Li, Xiaowei;  Yan, Guihai;  Ye, Jing;  Wang, Ying
收藏  |  浏览/下载:69/0  |  提交时间:2019/12/10
fault tolerance  on-chip  self-test  self-diagnosis  self-repair  
Performance-asymmetry-aware scheduling for Chip Multiprocessors with static core coupling 期刊论文
JOURNAL OF SYSTEMS ARCHITECTURE, 2010, 卷号: 56, 期号: 10, 页码: 534-542
作者:  Dong, Jianbo;  Zhang, Lei;  Han, Yinhe;  Yan, Guihai;  Li, Xiaowei
收藏  |  浏览/下载:40/0  |  提交时间:2019/12/16
Process variation  Thread-level redundancy  Chip Multiprocessor  Scheduling  
Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625
作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing
收藏  |  浏览/下载:45/0  |  提交时间:2019/12/16
compression  run-length coding  random access scan  power dissipation  test application time