Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time

doi:10.1093/ietisy/e89-d.10.2616

	Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time
	Hu, Yu ; Han, Yinhe ; Li, Xiaowei ; Li, Huawei ; Wen, Xiaoqing
	2006-10-01
发表期刊	IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
ISSN	0916-8532
卷号	E89D 期号:10 页码:2616-2625
摘要	LSI testing is critical to guarantee chips are fault-free before they are integrated in a system, so as to increase the reliability of the system. Although full-scan is a widely adopted design-for-testability technique for LSI design and testing, there is a strong need to reduce the test data Volume, scan-in Power dissipation, and test application Time (VPT) of full-scan testing. Based on the analysis of the characteristics of the variable-to-fixed run-length coding technique and the random access scan architecture, this paper presents a novel design scheme to tackle all VPT issues simultaneously. Experimental results on ISCAS'89 benchmarks have shown on average 51.2%, 99.5%, 99.3%, and 85.5% reduction effects in test data volume, average scan-in power dissipation, peak scan-in power dissipation, and test application time, respectively.
关键词	compression run-length coding random access scan power dissipation test application time
DOI	10.1093/ietisy/e89-d.10.2616
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Information Systems ; Computer Science, Software Engineering
WOS记录号	WOS:000241296100004
出版者	IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/10505
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Hu, Yu
作者单位	1.Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China 2.Kyushu Inst Technol, Fac Comp Sci & Syst Engn, Jizuka 8208502, Japan
推荐引用方式 GB/T 7714	Hu, Yu,Han, Yinhe,Li, Xiaowei,et al. Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2006,E89D(10):2616-2625.
APA	Hu, Yu,Han, Yinhe,Li, Xiaowei,Li, Huawei,&Wen, Xiaoqing.(2006).Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E89D(10),2616-2625.
MLA	Hu, Yu,et al."Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E89D.10(2006):2616-2625.