中国科学院计算技术研究所机构知识库

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限定条件	作者：Han, Yinhe    第一作者

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	Mathematical Framework for Optimizing Crossbar Allocation for ReRAM-based CNN Accelerators 期刊论文 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2024, 卷号: 29, 期号: 1, 页码: 24 作者:  Li, Wanqian;  Han, Yinhe;  Chen, Xiaoming 收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20 ReRAM crossbars  CNN accelerator  mathematical framework  crossbar allocation
	Frequency-Domain Inference Acceleration for Convolutional Neural Networks Using ReRAMs 期刊论文 IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS, 2023, 卷号: 34, 期号: 12, 页码: 3133-3146 作者:  Liu, Bosheng;  Jiang, Zhuoshen;  Wu, Yalan;  Wu, Jigang;  Chen, Xiaoming;  Liu, Peng;  Zhou, Qingguo;  Han, Yinhe 收藏  |  浏览/下载：8/0  |  提交时间：2023/12/04 Frequency-domain accelerator  energy efficiency  resistive random access memory  frequency-domain convolutions
	Power and Area Efficient FPGA Building Blocks Based on Ferroelectric FETs 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 期号: 5, 页码: 1780-1793 作者:  Chen, Xiaoming;  Ni, Kai;  Niemier, Michael T.;  Han, Yinhe;  Datta, Suman;  Hu, Xiaobo Sharon 收藏  |  浏览/下载：83/0  |  提交时间：2019/08/16 Ferroelectric field-effect transistor (FeFET)  field-programmable gate array (FPGA)  lookup table (LUT)  routing switch
	PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625 作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei 收藏  |  浏览/下载：53/0  |  提交时间：2019/12/13 3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput
	Enhanced Wear-Rate Leveling for PRAM Lifetime Improvement Considering Process Variation 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 1, 页码: 92-102 作者:  Han, Yinhe;  Dong, Jianbo;  Weng, Kaiheng;  Wang, Ying;  Li, Xiaowei 收藏  |  浏览/下载：42/0  |  提交时间：2019/12/13 Endurance  phase-change random access memory (PRAM)  wear leveling (WL)
	Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625 作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing 收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16 compression  run-length coding  random access scan  power dissipation  test application time