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A Fast Precision Tuning Solution for Always-On DNN Accelerators 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 5, 页码: 1236-1248
作者:  Wang, Ying;  He, Yintao;  Cheng, Long;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：25/0  |  提交时间：2022/12/07
Computer architecture  Neural networks  Computational modeling  Approximate computing  Tuning  Switches  Microprocessors  Always-on  CNN  computing-in-memory (CiM)  resistive RAM  
Capture-power-aware test data compression using selective encoding 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 205-216
作者:  Li, Jia;  Liu, Xiao;  Zhang, Yubin;  Hu, Yu;  Li, Xiaowei;  Xu, Qiang
收藏  |  浏览/下载：69/0  |  提交时间：2019/12/16
Test compression  Low-power testing  Scan-based testing  
Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2010, 卷号: E93D, 期号: 8, 页码: 2223-2232
作者:  Liu, Jun;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载：47/0  |  提交时间：2019/12/16
selective encoding  test data compression  test power reduction  flexible grouping  X-filling  
X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092
作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16
At-speed scan-based testing  low-power testing  X-filling  
Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625
作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing
收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16
compression  run-length coding  random access scan  power dissipation  test application time