Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power

doi:10.1587/transinf.E93.D.2223

	Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power
	Liu, Jun 1,2,3; Han, Yinhe 1,2; Li, Xiaowei 1,2
	2010-08-01
发表期刊	IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
ISSN	0916-8532
卷号	E93D 期号:8 页码:2223-2232
摘要	Test data volume and test power are two major concerns when testing modern large circuits. Recently, selective encoding of scan slices is proposed to compress test data. This encoding technique, unlike many other compression techniques encoding all the bits, only encodes the target-symbol by specifying a single bit index and copying group data. In this paper, we propose an extended selective encoding which presents two new techniques to optimize this method: a flexible grouping strategy, X bits exploitation and filling strategy. Flexible grouping strategy can decrease the number of groups which need to be encoded and improve test data compression ratio. X bits exploitation and filling strategy can exploit a large number of don't care bits to reduce testing power with no compression ratio loss. Experimental results show that the proposed technique needs less test data storage volume and reduces average weighted switching activity by 25.6% and peak weighted switching activity by 9.68% during scan shift compared to selective encoding.
关键词	selective encoding test data compression test power reduction flexible grouping X-filling
DOI	10.1587/transinf.E93.D.2223
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China (NSFC)[60633060] ; National Natural Science Foundation of China (NSFC)[60806014] ; National Natural Science Foundation of China (NSFC)[60831160526] ; National Natural Science Foundation of China (NSFC)[60803031] ; National Basic Research Program of China (973)[2005CB321604] ; Hi-Tech Research and Development Program of China (863)[2007AA01Z109] ; Hi-Tech Research and Development Program of China (863)[2007AA01Z113] ; Hi-Tech Research and Development Program of China (863)[2009AA01Z126]
WOS研究方向	Computer Science
WOS类目	Computer Science, Information Systems ; Computer Science, Software Engineering
WOS记录号	WOS:000281342300023
出版者	IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
引用统计
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/11999
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Liu, Jun
作者单位	1.Chinese Acad Sci, Grad Univ, Beijing 100864, Peoples R China 2.Chinese Acad Sci, Key Lab Comp Syst & Architecture, Inst Comp Technol, Beijing 100864, Peoples R China 3.Hefei Univ Technol, Sch Comp & Informat, Hefei, Peoples R China
推荐引用方式 GB/T 7714	Liu, Jun,Han, Yinhe,Li, Xiaowei. Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2010,E93D(8):2223-2232.
APA	Liu, Jun,Han, Yinhe,&Li, Xiaowei.(2010).Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E93D(8),2223-2232.
MLA	Liu, Jun,et al."Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E93D.8(2010):2223-2232.