Capture-power-aware test data compression using selective encoding

doi:10.1016/j.vlsi.2011.01.005

	Capture-power-aware test data compression using selective encoding
	Li, Jia 1; Liu, Xiao 2; Zhang, Yubin 2,4; Hu, Yu ; Li, Xiaowei 3; Xu, Qiang 2,4
	2011-06-01
发表期刊	INTEGRATION-THE VLSI JOURNAL
ISSN	0167-9260
卷号	44 期号:3 页码:205-216
摘要	Ever-increasing test data volume and excessive test power are two of the main concerns of VLSI testing. The "don't-care" bits (also known as X-bits) in given test cube can be exploited for test data compression and/or test power reduction, and these techniques may contradict to each other because the very same X-bits are likely to be used for different optimization objectives. This paper proposes a capture-power-aware test compression scheme that is able to keep capture-power under a safe limit with low test compression ratio loss. Experimental results on benchmark circuits validate the effectiveness of the proposed solution. (C) 2011 Elsevier B.V. All rights reserved.
关键词	Test compression Low-power testing Scan-based testing
DOI	10.1016/j.vlsi.2011.01.005
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[60425203] ; National Natural Science Foundation of China[60803031] ; National Natural Science Foundation of China[60876029] ; National Natural Science Foundation of China[60910003] ; National Natural Science Foundation of China[61006017] ; National Natural Science Foundation of China[61076018] ; NSFC/RGC[N_CUHK417/08] ; National Basic Research Program of China[2011C8302503] ; National High-Tech Research & Development Program of China[2009AA01Z129] ; Key Laboratory of Computer System and Architecture, ICT, CAS[ICT-ARCH200902] ; China Postdoctoral Science Foundation[20100470014] ; Hong Kong SAR Research Grants Council (RGC)[CUHK417807]
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Engineering, Electrical & Electronic
WOS记录号	WOS:000292011900006
出版者	ELSEVIER SCIENCE BV
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/12897
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, Jia
作者单位	1.Tsinghua Univ, Sch Software, Beijing 100084, Peoples R China 2.Chinese Univ Hong Kong, Dept Comp Sci & Engn, Shatin, Hong Kong, Peoples R China 3.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing, Peoples R China 4.CAS CUHK Shenzhen Inst Adv Technol, Shenzhen, Peoples R China
推荐引用方式 GB/T 7714	Li, Jia,Liu, Xiao,Zhang, Yubin,et al. Capture-power-aware test data compression using selective encoding[J]. INTEGRATION-THE VLSI JOURNAL,2011,44(3):205-216.
APA	Li, Jia,Liu, Xiao,Zhang, Yubin,Hu, Yu,Li, Xiaowei,&Xu, Qiang.(2011).Capture-power-aware test data compression using selective encoding.INTEGRATION-THE VLSI JOURNAL,44(3),205-216.
MLA	Li, Jia,et al."Capture-power-aware test data compression using selective encoding".INTEGRATION-THE VLSI JOURNAL 44.3(2011):205-216.