CSpace

浏览/检索结果: 共7条,第1-7条 帮助

已选(0)清除 条数/页:   排序方式:
SVFD: A Versatile Online Fault Detection Scheme via Checking of Stability Violation 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 9, 页码: 1627-1640
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载:71/0  |  提交时间:2019/12/16
Aging  delay fault  online fault detection  soft error  stability violation  
Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2010, 卷号: E93D, 期号: 8, 页码: 2223-2232
作者:  Liu, Jun;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载:51/0  |  提交时间:2019/12/16
selective encoding  test data compression  test power reduction  flexible grouping  X-filling  
X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092
作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei
收藏  |  浏览/下载:42/0  |  提交时间:2019/12/16
At-speed scan-based testing  low-power testing  X-filling  
Selected Crosstalk Avoidance Code for Reliable Network-on-Chip 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 6, 页码: 1074-1085
作者:  Zhang, Ying;  Li, Hua-Wei;  Li, Xiao-Wei
收藏  |  浏览/下载:45/0  |  提交时间:2019/12/16
crosstalk avoidance  codeword selection  reliable network-on-chip  single event upset  
Co-optimization of Dynamic/Static Test Power in Scan Test 期刊论文
CHINESE JOURNAL OF ELECTRONICS, 2009, 卷号: 18, 期号: 1, 页码: 54-58
作者:  Wang Wei;  Han Yinhe;  Li Xiaowei;  Fang Fang
收藏  |  浏览/下载:44/0  |  提交时间:2019/12/16
Co-optimization  Test power  Blocking logic  Minimum leakage vector  
Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046
作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei
收藏  |  浏览/下载:45/0  |  提交时间:2019/12/16
microprocessor design-for-testability  test generation  built-in self-test  at-speed testing  
BAT: Performance-Driven Crosstalk Mitigation Based on Bus-Grouping Asynchronous Transmission 期刊论文
IEICE TRANSACTIONS ON ELECTRONICS, 2008, 卷号: E91C, 期号: 10, 页码: 1690-1697
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei;  Liu, Hui
收藏  |  浏览/下载:39/0  |  提交时间:2019/12/16
crosstalk delay  on-chip buses  bus-grouping transmission  asynchronous  shielding