Co-optimization of Dynamic/Static Test Power in Scan Test

	Co-optimization of Dynamic/Static Test Power in Scan Test
	Wang Wei 1,2; Han Yinhe 2; Li Xiaowei 2; Fang Fang 1,2,3
	2009
发表期刊	CHINESE JOURNAL OF ELECTRONICS
ISSN	1022-4653
卷号	18 期号:1 页码:54-58
摘要	Low-power design has become a challenge of test. We propose an effective low-power scan architecture named PowerSluice to minimize power consumption during scan test, which is based on scan chain modifications. On one hand, a kind of blocking logic is inserted into the scan chain to reduce the dynamic power and two kinds of controlling units are also inserted to decrease the leakage power during the shift cycle. On the other hand, using genetic algorithm, the exact values of control signals are found out to control the process. Experiments results indicate that this architecture can effectually reduce power during scan test with probably minimum area cost.
关键词	Co-optimization Test power Blocking logic Minimum leakage vector
收录类别	SCI
语种	英语
资助项目	National High-Tech Research and Development Plan of China (863)[2007AA01Z113] ; National Natural Science Foundation of China (NSFC)[60606008] ; National Natural Science Foundation of China (NSFC)[60633060] ; National Natural Science Foundation of China (NSFC)[90607010] ; National Natural Science Foundation of China (NSFC)[60576031] ; National Natural Science Foundation of China (NSFC)[60876028] ; National Basic Research Program of China (973)[2005CB321605] ; National Basic Research Program of China (973)[2005CB321604] ; Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences[ICT-ARCH200704] ; China Postdoctoral Science Foundation[20080430050] ; Hefei University of Technology[070501F]
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000262975200010
出版者	TECHNOLOGY EXCHANGE LIMITED HONG KONG
引用统计
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/11908
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Wang Wei
作者单位	1.Hefei Univ Technol, Sch Comp & Informat, Hefei 230009, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100080, Peoples R China 3.Hefei Univ Technol, Sch Management, Hefei 230009, Peoples R China
推荐引用方式 GB/T 7714	Wang Wei,Han Yinhe,Li Xiaowei,et al. Co-optimization of Dynamic/Static Test Power in Scan Test[J]. CHINESE JOURNAL OF ELECTRONICS,2009,18(1):54-58.
APA	Wang Wei,Han Yinhe,Li Xiaowei,&Fang Fang.(2009).Co-optimization of Dynamic/Static Test Power in Scan Test.CHINESE JOURNAL OF ELECTRONICS,18(1),54-58.
MLA	Wang Wei,et al."Co-optimization of Dynamic/Static Test Power in Scan Test".CHINESE JOURNAL OF ELECTRONICS 18.1(2009):54-58.