中国科学院计算技术研究所机构知识库

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	SVFD: A Versatile Online Fault Detection Scheme via Checking of Stability Violation 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 9, 页码: 1627-1640 作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei 收藏  |  浏览/下载：72/0  |  提交时间：2019/12/16 Aging  delay fault  online fault detection  soft error  stability violation
	Scan chain design for shift power reduction in scan-based testing 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2011, 卷号: 54, 期号: 4, 页码: 767-777 作者:  Li Jia;  Hu Yu;  Li XiaoWei 收藏  |  浏览/下载：71/0  |  提交时间：2019/12/16 low power DfT  scan-based testing  test power reduction  scan chain design
	Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power 期刊论文 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2010, 卷号: E93D, 期号: 8, 页码: 2223-2232 作者:  Liu, Jun;  Han, Yinhe;  Li, Xiaowei 收藏  |  浏览/下载：52/0  |  提交时间：2019/12/16 selective encoding  test data compression  test power reduction  flexible grouping  X-filling
	X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092 作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei 收藏  |  浏览/下载：43/0  |  提交时间：2019/12/16 At-speed scan-based testing  low-power testing  X-filling
	Selected Crosstalk Avoidance Code for Reliable Network-on-Chip 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 6, 页码: 1074-1085 作者:  Zhang, Ying;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：46/0  |  提交时间：2019/12/16 crosstalk avoidance  codeword selection  reliable network-on-chip  single event upset
	Co-optimization of Dynamic/Static Test Power in Scan Test 期刊论文 CHINESE JOURNAL OF ELECTRONICS, 2009, 卷号: 18, 期号: 1, 页码: 54-58 作者:  Wang Wei;  Han Yinhe;  Li Xiaowei;  Fang Fang 收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16 Co-optimization  Test power  Blocking logic  Minimum leakage vector
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：46/0  |  提交时间：2019/12/16 microprocessor design-for-testability  test generation  built-in self-test  at-speed testing
	BAT: Performance-Driven Crosstalk Mitigation Based on Bus-Grouping Asynchronous Transmission 期刊论文 IEICE TRANSACTIONS ON ELECTRONICS, 2008, 卷号: E91C, 期号: 10, 页码: 1690-1697 作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei;  Liu, Hui 收藏  |  浏览/下载：40/0  |  提交时间：2019/12/16 crosstalk delay  on-chip buses  bus-grouping transmission  asynchronous  shielding