中国科学院计算技术研究所机构知识库

浏览/检索结果: 共8条，第1-8条

帮助

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序WOS被引频次升序WOS被引频次降序提交时间升序提交时间降序期刊影响因子升序期刊影响因子降序题名升序题名降序发表日期升序发表日期降序
	SVFD: A Versatile Online Fault Detection Scheme via Checking of Stability Violation 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 9, 页码: 1627-1640 作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei 收藏  |  浏览/下载：71/0  |  提交时间：2019/12/16 Aging  delay fault  online fault detection  soft error  stability violation
	Scan chain design for shift power reduction in scan-based testing 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2011, 卷号: 54, 期号: 4, 页码: 767-777 作者:  Li Jia;  Hu Yu;  Li XiaoWei 收藏  |  浏览/下载：70/0  |  提交时间：2019/12/16 low power DfT  scan-based testing  test power reduction  scan chain design
	Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power 期刊论文 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2010, 卷号: E93D, 期号: 8, 页码: 2223-2232 作者:  Liu, Jun;  Han, Yinhe;  Li, Xiaowei 收藏  |  浏览/下载：51/0  |  提交时间：2019/12/16 selective encoding  test data compression  test power reduction  flexible grouping  X-filling
	X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092 作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei 收藏  |  浏览/下载：42/0  |  提交时间：2019/12/16 At-speed scan-based testing  low-power testing  X-filling
	Selected Crosstalk Avoidance Code for Reliable Network-on-Chip 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 6, 页码: 1074-1085 作者:  Zhang, Ying;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16 crosstalk avoidance  codeword selection  reliable network-on-chip  single event upset
	Co-optimization of Dynamic/Static Test Power in Scan Test 期刊论文 CHINESE JOURNAL OF ELECTRONICS, 2009, 卷号: 18, 期号: 1, 页码: 54-58 作者:  Wang Wei;  Han Yinhe;  Li Xiaowei;  Fang Fang 收藏  |  浏览/下载：44/0  |  提交时间：2019/12/16 Co-optimization  Test power  Blocking logic  Minimum leakage vector
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16 microprocessor design-for-testability  test generation  built-in self-test  at-speed testing
	BAT: Performance-Driven Crosstalk Mitigation Based on Bus-Grouping Asynchronous Transmission 期刊论文 IEICE TRANSACTIONS ON ELECTRONICS, 2008, 卷号: E91C, 期号: 10, 页码: 1690-1697 作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei;  Liu, Hui 收藏  |  浏览/下载：39/0  |  提交时间：2019/12/16 crosstalk delay  on-chip buses  bus-grouping transmission  asynchronous  shielding