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Architecting Effectual Computation for Machine Learning Accelerators 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 10, 页码: 2654-2667
作者:  Lu, Hang;  Zhang, Mingzhe;  Han, Yinhe;  Wang, Qi;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：88/0  |  提交时间：2020/12/10
Computational modeling  Throughput  Adders  Machine learning  Acceleration  Kernel  Computational efficiency  Accelerator architectures  neural network hardware  multiplying circuits  
A Low Overhead In-Network Data Compressor for the Memory Hierarchy of Chip Multiprocessors 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2018, 卷号: 37, 期号: 6, 页码: 1265-1277
作者:  Wang, Ying;  Li, Huawei;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载：67/0  |  提交时间：2019/12/10
Cache  chip multiprocessor (CMP)  compression  memory hierarchy  network-on-chip (NoC)  
STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296
作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12
Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)  
PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/13
3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput  
VANUCA: Enabling Near-Threshold Voltage Operation in Large-Capacity Cache 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 3, 页码: 858-870
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：35/0  |  提交时间：2019/12/13
Cache design  fault tolerant  multi-V-dd  near-threshold voltage (NTV)  nonuniform cache access (NUCA)  
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing  
A New Multiple-Round Dimension-Order Routing for Networks-on-Chip 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2011, 卷号: E94D, 期号: 4, 页码: 809-821
作者:  Fu, Binzhang;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：70/0  |  提交时间：2019/12/16
network-on-chip (NoC)  fault-tolerant routing  multiple round dimension-order routing  turn model  
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 卷号: 15, 期号: 5, 页码: 531-540
作者:  Han, Yinhe;  Hu, Yu;  Li, Xiaowei;  Li, Huawei;  Chandra, Anshuman
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16
automatic test equipment (ATE)  Godson processor  MUX network  test stimulus decompression  
Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625
作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing
收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16
compression  run-length coding  random access scan  power dissipation  test application time