中国科学院计算技术研究所机构知识库

浏览/检索结果: 共5条，第1-5条

帮助

限定条件

发表日期：2022

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	Re-FeMAT: A Reconfigurable Multifunctional FeFET-Based Memory Architecture 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 11, 页码: 5071-5084 作者:  Zhang, Xiaoyu;  Liu, Rui;  Song, Tao;  Yang, Yuxin;  Han, Yinhe;  Chen, Xiaoming 收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12 Convolutional neural network (CNN)  ferroelectric field-effect transistor (FeFET)  few-shot learning  in-memory processing  ternary content-addressable memory (TCAM)
	Secured Data Transmission Over Insecure Networks-on-Chip by Modulating Inter-Packet Delays 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 11, 页码: 4313-4324 作者:  Xu, Jiaen;  Wang, Xiaohang;  Jiang, Yingtao;  Singh, Amit Kumar;  Gu, Chongyan;  Huang, Letian;  Yang, Mei;  Li, Shunbin 收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12 Block coding  inter-packet delay  network-on-chip (NoC)  secure channel
	HyCA: A Hybrid Computing Architecture for Fault-Tolerant Deep Learning 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 10, 页码: 3400-3413 作者:  Liu, Cheng;  Chu, Cheng;  Xu, Dawen;  Wang, Ying;  Wang, Qianlong;  Li, Huawei;  Li, Xiaowei;  Cheng, Kwang-Ting 收藏  |  浏览/下载：25/0  |  提交时间：2022/12/07 Circuit faults  Computational modeling  Deep learning  Hardware  Redundancy  Neural networks  Computer architecture  Deep learning accelerator (DLA)  fault detection  fault tolerance  hybrid computing architecture (HyCA)
	Modeling and Optimization of Low-Power AND Gates Based on Stochastic Thermodynamics 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2022, 卷号: 69, 期号: 9, 页码: 3729-3733 作者:  Kuang, Jiayue;  Ge, Xiaohu;  Yang, Yang;  Tian, Lin 收藏  |  浏览/下载：21/0  |  提交时间：2022/12/07 Logic gates  Transistors  Energy states  Thermodynamics  Voltage  Energy consumption  Integrated circuit modeling  Stochastic thermodynamics  subthreshold voltage  single-electron transistor  AND gate  order of operations
	Accurate reliability analysis methods for approximate computing circuits 期刊论文 TSINGHUA SCIENCE AND TECHNOLOGY, 2022, 卷号: 27, 期号: 4, 页码: 729-740 作者:  Wang, Zhen;  Zhang, Guofa;  Ye, Jing;  Jiang, Jianhui;  Li, Fengyong;  Wang, Yong 收藏  |  浏览/下载：31/0  |  提交时间：2022/06/21 Reliability  Integrated circuit reliability  Correlation  Probability  Approximate computing  Integrated circuit modeling  Circuit faults  Approximate Computing Circuit (ACC)  correlation coefficient  iterative Probabilistic Transfer Matrix (PTM)  reliability