中国科学院计算技术研究所机构知识库

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限定条件	作者：Wang, Ying    第一作者

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	Variation Enhanced Attacks Against RRAM-Based Neuromorphic Computing System 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1588-1596 作者:  Lv, Hao;  Li, Bing;  Zhang, Lei;  Liu, Cheng;  Wang, Ying 收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04 Security  Hardware  Neuromorphic engineering  Computational modeling  Circuit faults  Resistance  Immune system  Adversarial attack  fault injection attack  neuromorphic computing system (NCS)  processing in memory  reliability  resistive memory
	HyCA: A Hybrid Computing Architecture for Fault-Tolerant Deep Learning 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 10, 页码: 3400-3413 作者:  Liu, Cheng;  Chu, Cheng;  Xu, Dawen;  Wang, Ying;  Wang, Qianlong;  Li, Huawei;  Li, Xiaowei;  Cheng, Kwang-Ting 收藏  |  浏览/下载：25/0  |  提交时间：2022/12/07 Circuit faults  Computational modeling  Deep learning  Hardware  Redundancy  Neural networks  Computer architecture  Deep learning accelerator (DLA)  fault detection  fault tolerance  hybrid computing architecture (HyCA)
	Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484 作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting 收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01 Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability
	Field-Free 3T2SOT MRAM for Non-Volatile Cache Memories 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 卷号: 67, 期号: 12, 页码: 4660-4669 作者:  Wu, Bi;  Wang, Chao;  Wang, Zhaohao;  Wang, Ying;  Zhang, Deming;  Liu, Dijun;  Zhang, Youguang;  Hu, Xiaobo Sharon 收藏  |  浏览/下载：37/0  |  提交时间：2021/12/01 Random access memory  Magnetic tunneling  Switches  Reliability  Tunneling magnetoresistance  Metals  Transistors  SOT-MRAM  low power  high speed  high reliability
	Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2018, 卷号: 61, 期号: 11, 页码: 17 作者:  Li, Xiaowei;  Yan, Guihai;  Ye, Jing;  Wang, Ying 收藏  |  浏览/下载：69/0  |  提交时间：2019/12/10 fault tolerance  on-chip  self-test  self-diagnosis  self-repair