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Fault Modeling and Efficient Testing of Memristor-Based Memory 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2021, 卷号: 68, 期号: 11, 页码: 4444-4455
作者:  Liu, Peng;  You, Zhiqiang;  Wu, Jigang;  Liu, Bosheng;  Han, Yinhe;  Chakrabarty, Krishnendu
收藏  |  浏览/下载：25/0  |  提交时间：2022/06/21
Electrical defects  fault model  defect-oriented testing  March algorithm  non-volatile memory  
Power and Area Efficient FPGA Building Blocks Based on Ferroelectric FETs 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 期号: 5, 页码: 1780-1793
作者:  Chen, Xiaoming;  Ni, Kai;  Niemier, Michael T.;  Han, Yinhe;  Datta, Suman;  Hu, Xiaobo Sharon
收藏  |  浏览/下载：83/0  |  提交时间：2019/08/16
Ferroelectric field-effect transistor (FeFET)  field-programmable gate array (FPGA)  lookup table (LUT)  routing switch  
STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296
作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12
Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)  
ReviveNet: A Self-Adaptive Architecture for Improving Lifetime Reliability via Localized Timing Adaptation 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2011, 卷号: 60, 期号: 9, 页码: 1219-1232
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载：64/0  |  提交时间：2019/12/16
Lifetime reliability  self-adaptive  aging sensor  timing adaptation  NBTI  
SVFD: A Versatile Online Fault Detection Scheme via Checking of Stability Violation 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 9, 页码: 1627-1640
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16
Aging  delay fault  online fault detection  soft error  stability violation  
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing  
A New Multiple-Round Dimension-Order Routing for Networks-on-Chip 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2011, 卷号: E94D, 期号: 4, 页码: 809-821
作者:  Fu, Binzhang;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：70/0  |  提交时间：2019/12/16
network-on-chip (NoC)  fault-tolerant routing  multiple round dimension-order routing  turn model  
MicroFix: Using Timing Interpolation and Delay Sensors for Power Reduction 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2011, 卷号: 16, 期号: 2, 页码: 21
作者:  Yan, Guihai;  Han, Yinhe;  Liu, Hui;  Liang, Xiaoyao;  Li, Xiaowei
收藏  |  浏览/下载：65/0  |  提交时间：2019/12/16
Design  Performance  Reliability  Power reduction  fine-grained adaptability  DVFS  timing interpolation  delay sensor  
Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625
作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing
收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16
compression  run-length coding  random access scan  power dissipation  test application time