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MRFI: An Open-Source Multiresolution Fault Injection Framework for Neural Network Processing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 11
作者:  Huang, Haitong;  Liu, Cheng;  Xue, Xinghua;  Liu, Bo;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：3/0  |  提交时间：2024/05/20
Biological neural networks  Hardware  Reliability  Computational modeling  Neural networks  Fault tolerant systems  Fault tolerance  Fault evaluation  fault injection  fault simulation  multiresolution  neural network reliability  
Exploring Winograd Convolution for Cost-Effective Neural Network Fault Tolerance 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 11, 页码: 1763-1773
作者:  Xue, Xinghua;  Liu, Cheng;  Liu, Bo;  Huang, Haitong;  Wang, Ying;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Fault tolerant systems  Fault tolerance  Artificial neural networks  Convolution  Reliability  Computational modeling  Neurons  Fault-tolerance  soft errors  vulnerability analysis  winograd convolution (WG-Conv)  
BitXpro: Regularity-Aware Hardware Runtime Pruning for Deep Neural Networks 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 1, 页码: 90-103
作者:  Li, Hongyan;  Lu, Hang;  Wang, Haoxuan;  Deng, Shengji;  Li, Xiaowei
收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12
Deep learning accelerator  deep neural network (DNN)  hardware runtime pruning  
Resilience-Aware Frequency Tuning for Neural-Network-Based Approximate Computing Chips 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 10, 页码: 2736-2748
作者:  Wang, Ying;  Deng, Jiachao;  Fang, Yuntan;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/12
Deep learning  error tolerance  neural network (NN)  timing variation  
STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296
作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12
Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)  
PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/13
3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput  
RISO: Enforce Noninterfered Performance With Relaxed Network-on-Chip Isolation in Many-Core Cloud Processors 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2015, 卷号: 23, 期号: 12, 页码: 3053-3064
作者:  Lu, Hang;  Fu, Binzhang;  Wang, Ying;  Han, Yinhe;  Yan, Guihai;  Li, Xiaowei
收藏  |  浏览/下载：39/0  |  提交时间：2019/12/13
Cloud processor  networks-on-chip (NoCs)  performance isolation  relaxed isolation (RISO)  workload consolidation  
Data Remapping for Static NUCA in Degradable Chip Multiprocessors 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2015, 卷号: 23, 期号: 5, 页码: 879-892
作者:  Wang, Ying;  Zhang, Lei;  Han, Yin-He;  Li, Hua-Wei;  Li, Xiaowei
收藏  |  浏览/下载：37/0  |  提交时间：2019/12/13
Chip multiprocessor (CMP)  fault tolerant  network-on-chip (NoC)  nonuniform cache architecture (NUCA)  
Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 10, 页码: 1787-1800
作者:  Zhang, Ying;  Li, Huawei;  Min, Yinghua;  Li, Xiaowei
收藏  |  浏览/下载：63/0  |  提交时间：2019/12/16
Crosstalk  crosstalk tolerance  interconnects  network-on-chip (NOC)  
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 卷号: 15, 期号: 5, 页码: 531-540
作者:  Han, Yinhe;  Hu, Yu;  Li, Xiaowei;  Li, Huawei;  Chandra, Anshuman
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16
automatic test equipment (ATE)  Godson processor  MUX network  test stimulus decompression