CSpace

浏览/检索结果: 共18条,第1-10条 帮助

限定条件                    
已选(0)清除 条数/页:   排序方式:
Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982
作者:  Zhang, Minjin;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:77/0  |  提交时间:2019/12/16
Crosstalk-induced delay  delay testing  path delay fault  signal integrity  test generation  timing analysis  
Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 10, 页码: 1787-1800
作者:  Zhang, Ying;  Li, Huawei;  Min, Yinghua;  Li, Xiaowei
收藏  |  浏览/下载:74/0  |  提交时间:2019/12/16
Crosstalk  crosstalk tolerance  interconnects  network-on-chip (NOC)  
ReviveNet: A Self-Adaptive Architecture for Improving Lifetime Reliability via Localized Timing Adaptation 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2011, 卷号: 60, 期号: 9, 页码: 1219-1232
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载:68/0  |  提交时间:2019/12/16
Lifetime reliability  self-adaptive  aging sensor  timing adaptation  NBTI  
SVFD: A Versatile Online Fault Detection Scheme via Checking of Stability Violation 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 9, 页码: 1627-1640
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载:71/0  |  提交时间:2019/12/16
Aging  delay fault  online fault detection  soft error  stability violation  
A Loss Inference Algorithm for Wireless Sensor Networks to Improve Data Reliability of Digital Ecosystems 期刊论文
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2011, 卷号: 58, 期号: 6, 页码: 2126-2137
作者:  Yang, Yu;  Xu, Yongjun;  Li, Xiaowei;  Chen, Canfeng
收藏  |  浏览/下载:77/0  |  提交时间:2019/12/16
Cyber-physical ecosystems (CPEs)  data aggregation  digital ecosystems (DEs)  network performance measurement  network tomography  wireless sensor networks (WSNs)  
Capture-power-aware test data compression using selective encoding 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 205-216
作者:  Li, Jia;  Liu, Xiao;  Zhang, Yubin;  Hu, Yu;  Li, Xiaowei;  Xu, Qiang
收藏  |  浏览/下载:73/0  |  提交时间:2019/12/16
Test compression  Low-power testing  Scan-based testing  
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:71/0  |  提交时间:2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing  
A New Multiple-Round Dimension-Order Routing for Networks-on-Chip 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2011, 卷号: E94D, 期号: 4, 页码: 809-821
作者:  Fu, Binzhang;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:74/0  |  提交时间:2019/12/16
network-on-chip (NoC)  fault-tolerant routing  multiple round dimension-order routing  turn model  
Scan chain design for shift power reduction in scan-based testing 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2011, 卷号: 54, 期号: 4, 页码: 767-777
作者:  Li Jia;  Hu Yu;  Li XiaoWei
收藏  |  浏览/下载:70/0  |  提交时间:2019/12/16
low power DfT  scan-based testing  test power reduction  scan chain design  
MicroFix: Using Timing Interpolation and Delay Sensors for Power Reduction 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2011, 卷号: 16, 期号: 2, 页码: 21
作者:  Yan, Guihai;  Han, Yinhe;  Liu, Hui;  Liang, Xiaoyao;  Li, Xiaowei
收藏  |  浏览/下载:69/0  |  提交时间:2019/12/16
Design  Performance  Reliability  Power reduction  fine-grained adaptability  DVFS  timing interpolation  delay sensor