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Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727
作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui
收藏  |  浏览/下载:60/0  |  提交时间:2020/12/10
Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)  
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum 期刊论文
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 1998, 卷号: 26, 期号: 1, 页码: 53-64
作者:  Zhou, YQ;  Wong, MWT;  Min, YH
收藏  |  浏览/下载:71/0  |  提交时间:2019/12/16
error correction  error detection  fault tolerance  linear analog circuits  self-checking