On concurrent multiple error diagnosability in linear analog circuits using continuous checksum

	On concurrent multiple error diagnosability in linear analog circuits using continuous checksum
	Zhou, YQ ; Wong, MWT ; Min, YH
	1998
发表期刊	INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS
ISSN	0098-9886
卷号	26 期号:1 页码:53-64
摘要	Although most of the work done in fault tolerance is in the digital field, it is widely understood that error detection and correction capability in analog circuits has the same importance as in digital circuits. The technique proposed by Abhijit Chatterjee can realize concurrent single error detection and correction in linear analog circuits well. Based on his work, this paper addresses concurrent multiple error detection and correction in linear analog systems, which is known to be a difficult and unsolved problem. We prove that the concurrent error diagnosis scheme using continuous checksum can not be extended to the case of multiple errors under the assumption that the checker and the functional block will not fail simultaneously, though people are still attempting to make such an extension. (C) 1998 John Wiley gr Sons, Ltd.
关键词	error correction error detection fault tolerance linear analog circuits self-checking
收录类别	SCI
语种	英语
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000071991500005
出版者	WILEY-BLACKWELL
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13274
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Zhou, YQ
作者单位	1.Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore 2.Hong Kong Polytech Univ, Dept Elect Engn, Hong Kong, Hong Kong 3.Chinese Acad Sci, ICT, CAD Lab, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Zhou, YQ,Wong, MWT,Min, YH. On concurrent multiple error diagnosability in linear analog circuits using continuous checksum[J]. INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS,1998,26(1):53-64.
APA	Zhou, YQ,Wong, MWT,&Min, YH.(1998).On concurrent multiple error diagnosability in linear analog circuits using continuous checksum.INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS,26(1),53-64.
MLA	Zhou, YQ,et al."On concurrent multiple error diagnosability in linear analog circuits using continuous checksum".INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS 26.1(1998):53-64.