中国科学院计算技术研究所机构知识库

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	A data-centric chip design agent framework for Verilog code generation 期刊论文 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2025, 卷号: 30, 期号: 6, 页码: 27 作者:  Chang, Kaiyan;  Zhu, Wenlong;  Wang, Kun;  He, Xinyang;  Yang, Nan;  Chen, Zhirong;  Jin, Dantong;  Li, Cangyuan;  Zhou, Yunhao;  Yan, Hao;  Zhao, Zhuoliang;  Cheng, Yuan;  Wang, Mengdi;  Liang, Shengwen;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wang, Ying 收藏  |  浏览/下载：1/0  |  提交时间：2026/05/25 Large language model  hardware generation  data augmentation
	Crypto-DSEDA: A Domain-Specific EDA Flow for CiM-Based Cryptographic Accelerators 期刊论文 IEEE DESIGN & TEST, 2024, 卷号: 41, 期号: 5, 页码: 46-54 作者:  Liu, Rui;  Li, Zerun;  Zhang, Xiaoyu;  Li, Wanqian;  Shen, Libo;  Tang, Rui;  Luo, Zhejian;  Chen, Xiaoming;  Han, Yinhe;  Tang, Minghua 收藏  |  浏览/下载：49/0  |  提交时间：2024/12/06 Computer architecture  Cryptography  Optimization  Table lookup  Hardware acceleration  Resource management  Space exploration  Computing-in-memory  electronic design automation  cryptographic algorithm  automatic generation
	HTDet: A Clustering Method Using Information Entropy for Hardware Trojan Detection 期刊论文 TSINGHUA SCIENCE AND TECHNOLOGY, 2021, 卷号: 26, 期号: 1, 页码: 48-61 作者:  Lu, Renjie;  Shen, Haihua;  Feng, Zhihua;  Li, Huawei;  Zhao, Wei;  Li, Xiaowei 收藏  |  浏览/下载：106/0  |  提交时间：2021/12/01 Hardware Trojan (HT) detection  information entropy  Density-Based Spatial Clustering of Applications with Noise (DBSCAN)  unsupervised learning  clustering  mutual information  test patterns generation
	Evaluating and Constraining Hardware Assertions with Absent Scenarios 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2020, 卷号: 35, 期号: 5, 页码: 1198-1216 作者:  Chao, Hui-Na;  Li, Hua-Wei;  Song, Xiaoyu;  Wang, Tian-Cheng;  Li, Xiao-Wei 收藏  |  浏览/下载：82/0  |  提交时间：2021/12/01 hardware formal verification  assertion generation  data mining  assertion evaluation  assertion coverage
	A novel RTL behavioral description based ATPG method 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2003, 卷号: 18, 期号: 3, 页码: 308-317 作者:  Yin, ZG;  Min, YH;  Li, XW;  Li, HW 收藏  |  浏览/下载：106/0  |  提交时间：2019/12/16 RTL (Register Transfer Level)  ATPG (Automatic Test Pattern Generation)  behavioral description  HDL (Hardware Description Language)