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Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators 期刊论文
IEEE DESIGN & TEST, 2025, 卷号: 42, 期号: 3, 页码: 66-73
作者:  Li, Wen;  Wang, Ying;  Li, Huawei;  Li, Xiaowei;  Zou, Kaiwei
收藏  |  浏览/下载:4/0  |  提交时间:2025/06/25
Accuracy  Fault tolerant systems  Fault tolerance  Deep learning  Image edge detection  Fault detection  Computational modeling  Training  Reliability  Hafnium  Deep Neural Network  ReRAM  Functional Test  Computing-in-Memory  
Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2016, 卷号: 35, 期号: 6, 页码: 999-1011
作者:  Zhou, Yanhong;  Wang, Tiancheng;  Li, Huawei;  Lv, Tao;  Li, Xiaowei
收藏  |  浏览/下载:88/0  |  提交时间:2019/12/13
Abstraction-guided simulation  functional test generation  hard-to-reach states  path constraint solving