Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators

doi:10.1109/MDAT.2024.3490405

	Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators
	Li, Wen 1,2; Wang, Ying 3,4; Li, Huawei 3,4; Li, Xiaowei 3,4; Zou, Kaiwei 5
	2025-06-01
发表期刊	IEEE DESIGN & TEST
ISSN	2168-2356
卷号	42 期号:3 页码:66-73
关键词	Accuracy Fault tolerant systems Fault tolerance Deep learning Image edge detection Fault detection Computational modeling Training Reliability Hafnium Deep Neural Network ReRAM Functional Test Computing-in-Memory
DOI	10.1109/MDAT.2024.3490405
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[62302283] ; National Natural Science Foundation of China[62222411] ; National Key Research and Development Program of China[2023YFB4404400] ; Shanxi Basic Research Program[202303021212015]
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Engineering, Electrical & Electronic
WOS记录号	WOS:001471147300010
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/40615
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Wang, Ying; Li, Huawei
作者单位	1.Shanxi Univ, Sch Comp & Informat Technol, Taiyuan 030006, Shanxi, Peoples R China 2.Shanxi Univ, Inst Big Data Sci & Ind, Taiyuan 030006, Shanxi, Peoples R China 3.Chinese Acad Sci, Inst Comp Technol, State Key Lab Processors, Beijing 100190, Peoples R China 4.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 5.Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
推荐引用方式 GB/T 7714	Li, Wen,Wang, Ying,Li, Huawei,et al. Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators[J]. IEEE DESIGN & TEST,2025,42(3):66-73.
APA	Li, Wen,Wang, Ying,Li, Huawei,Li, Xiaowei,&Zou, Kaiwei.(2025).Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators.IEEE DESIGN & TEST,42(3),66-73.
MLA	Li, Wen,et al."Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators".IEEE DESIGN & TEST 42.3(2025):66-73.