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In-Memory Wallace Tree Multipliers Based on Majority Gates Within Voltage-Gated SOT-MRAM Crossbar Arrays 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 8
作者:  Hui, Yajuan;  Li, Qingzhen;  Wang, Leimin;  Liu, Cheng;  Zhang, Deming;  Miao, Xiangshui
收藏  |  浏览/下载:21/0  |  提交时间:2024/05/20
In-memory computing  majority gates  voltage-gated SOT-MRAM  Wallace tree multiplier  
Field-Free 3T2SOT MRAM for Non-Volatile Cache Memories 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 卷号: 67, 期号: 12, 页码: 4660-4669
作者:  Wu, Bi;  Wang, Chao;  Wang, Zhaohao;  Wang, Ying;  Zhang, Deming;  Liu, Dijun;  Zhang, Youguang;  Hu, Xiaobo Sharon
收藏  |  浏览/下载:47/0  |  提交时间:2021/12/01
Random access memory  Magnetic tunneling  Switches  Reliability  Tunneling magnetoresistance  Metals  Transistors  SOT-MRAM  low power  high speed  high reliability