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Exploring Winograd Convolution for Cost-Effective Neural Network Fault Tolerance 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 11, 页码: 1763-1773
作者:  Xue, Xinghua;  Liu, Cheng;  Liu, Bo;  Huang, Haitong;  Wang, Ying;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:2/0  |  提交时间:2024/05/20
Fault tolerant systems  Fault tolerance  Artificial neural networks  Convolution  Reliability  Computational modeling  Neurons  Fault-tolerance  soft errors  vulnerability analysis  winograd convolution (WG-Conv)  
Soft Error Reliability Analysis of Vision Transformers 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11
作者:  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Yang, Bing;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:7/0  |  提交时间:2023/12/04
ABFT  fault-tolerance  soft errors  vision transformers (ViTs)  vulnerability analysis  
Network Pruning for Bit-Serial Accelerators 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1597-1609
作者:  Zhao, Xiandong;  Wang, Ying;  Liu, Cheng;  Shi, Cong;  Tu, Kaijie;  Zhang, Lei
收藏  |  浏览/下载:7/0  |  提交时间:2023/12/04
AI accelerators  neural networks (NNs)  NN compression  
Variation Enhanced Attacks Against RRAM-Based Neuromorphic Computing System 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1588-1596
作者:  Lv, Hao;  Li, Bing;  Zhang, Lei;  Liu, Cheng;  Wang, Ying
收藏  |  浏览/下载:7/0  |  提交时间:2023/12/04
Security  Hardware  Neuromorphic engineering  Computational modeling  Circuit faults  Resistance  Immune system  Adversarial attack  fault injection attack  neuromorphic computing system (NCS)  processing in memory  reliability  resistive memory  
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting
收藏  |  浏览/下载:38/0  |  提交时间:2021/12/01
Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability