中国科学院计算技术研究所机构知识库

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发表日期：2020

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	A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 12, 页码: 4524-4536 作者:  Cui, Aijiao;  Li, Mengyang;  Qu, Gang;  Li, Huawei 收藏  |  浏览/下载：29/0  |  提交时间：2021/12/01 Ciphers  Encryption  Integrated circuits  Side-channel attacks  Testing  Cryptographic hash function  obfuscation logic  scan design  scan-based side-channel attack
	Architecting Effectual Computation for Machine Learning Accelerators 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 10, 页码: 2654-2667 作者:  Lu, Hang;  Zhang, Mingzhe;  Han, Yinhe;  Wang, Qi;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：88/0  |  提交时间：2020/12/10 Computational modeling  Throughput  Adders  Machine learning  Acceleration  Kernel  Computational efficiency  Accelerator architectures  neural network hardware  multiplying circuits
	Evaluating and Constraining Hardware Assertions with Absent Scenarios 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2020, 卷号: 35, 期号: 5, 页码: 1198-1216 作者:  Chao, Hui-Na;  Li, Hua-Wei;  Song, Xiaoyu;  Wang, Tian-Cheng;  Li, Xiao-Wei 收藏  |  浏览/下载：30/0  |  提交时间：2021/12/01 hardware formal verification  assertion generation  data mining  assertion evaluation  assertion coverage
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui 收藏  |  浏览/下载：51/0  |  提交时间：2020/12/10 Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)