CSpace

浏览/检索结果: 共4条,第1-4条 帮助

限定条件        
已选(0)清除 条数/页:   排序方式:
Statistical Modeling of Soft Error Influence on Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 11, 页码: 4152-4163
作者:  Huang, Haitong;  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Luo, Tao;  Cheng, Long;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:2/0  |  提交时间:2024/05/20
Fault analysis  fault simulation  neural network (NN) reliability  statistical fault modeling  
LMDet: A "Naturalness" Statistical Method for Hardware Trojan Detection 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 卷号: 26, 期号: 4, 页码: 720-732
作者:  Shen, Haihua;  Tan, Huazhe;  Li, Huawei;  Zhang, Feng;  Li, Xiaowei
收藏  |  浏览/下载:53/0  |  提交时间:2019/12/10
Hardware Trojan (HT) detection  natural language processing (NLP)  n-gram language model  statistical analysis  
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:67/0  |  提交时间:2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing  
Testable Critical Path Selection Considering Process Variation 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2010, 卷号: E93D, 期号: 1, 页码: 59-67
作者:  Fu, Xiang;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:39/0  |  提交时间:2019/12/16
testable critical path selection  process variation