Testable Critical Path Selection Considering Process Variation

doi:10.1587/transinf.E93.D.59

	Testable Critical Path Selection Considering Process Variation
	Fu, Xiang 1,2; Li, Huawei 1,2; Li, Xiaowei 1,2
	2010
发表期刊	IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
ISSN	0916-8532
卷号	E93D 期号:1 页码:59-67
摘要	Critical path selection is very important in delay testing. Critical paths found by conventional static timing analysis (STA) tools are inadequate to represent the real timing of the circuit, since neither the testability of paths nor the statistical variation of cell delays caused by process variation is considered. This paper proposed a novel path selection method considering process variation. The circuit is firstly simplified by eliminating non-critical edges under statistical timing model, and then divided into sub-circuits, while each sub-circuit has only one prime input (PI) and one prime output (PO). Critical paths are selected only in critical sub-circuits. The concept of partially critical edges (PCEs) and completely critical edges, (CCEs) are introduced to speed up the path selection procedure. Two path selection strategies are also presented to search for a testable critical path set to cover all the critical edges. The experimental results showed that the proposed circuit division approach is efficient in path number reduction, and PCE's and CCEs play an important role as a guideline during path selection.
关键词	testable critical path selection process variation
DOI	10.1587/transinf.E93.D.59
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China (NSFC)[60776031] ; National Natural Science Foundation of China (NSFC)[60606008] ; National Natural Science Foundation of China (NSFC)[60633060] ; Hi-Tech Research and Development Program of China[2007AA01Z476] ; Hi-Tech Research and Development Program of China[2007AA01Z109] ; Hi-Tech Research and Development Program of China[2007AA01Z113] ; National Basic Research Program of China[2005CB321605]
WOS研究方向	Computer Science
WOS类目	Computer Science, Information Systems ; Computer Science, Software Engineering
WOS记录号	WOS:000274506200009
出版者	IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/12154
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Fu, Xiang
作者单位	1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing 100039, Peoples R China
推荐引用方式 GB/T 7714	Fu, Xiang,Li, Huawei,Li, Xiaowei. Testable Critical Path Selection Considering Process Variation[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2010,E93D(1):59-67.
APA	Fu, Xiang,Li, Huawei,&Li, Xiaowei.(2010).Testable Critical Path Selection Considering Process Variation.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E93D(1),59-67.
MLA	Fu, Xiang,et al."Testable Critical Path Selection Considering Process Variation".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E93D.1(2010):59-67.