中国科学院计算技术研究所机构知识库

浏览/检索结果: 共9条，第1-9条

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限定条件	作者：Li, Xiaowei    第一作者    发表日期：2011

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	Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982 作者:  Zhang, Minjin;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：73/0  |  提交时间：2019/12/16 Crosstalk-induced delay  delay testing  path delay fault  signal integrity  test generation  timing analysis
	Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 10, 页码: 1787-1800 作者:  Zhang, Ying;  Li, Huawei;  Min, Yinghua;  Li, Xiaowei 收藏  |  浏览/下载：63/0  |  提交时间：2019/12/16 Crosstalk  crosstalk tolerance  interconnects  network-on-chip (NOC)
	ReviveNet: A Self-Adaptive Architecture for Improving Lifetime Reliability via Localized Timing Adaptation 期刊论文 IEEE TRANSACTIONS ON COMPUTERS, 2011, 卷号: 60, 期号: 9, 页码: 1219-1232 作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei 收藏  |  浏览/下载：64/0  |  提交时间：2019/12/16 Lifetime reliability  self-adaptive  aging sensor  timing adaptation  NBTI
	SVFD: A Versatile Online Fault Detection Scheme via Checking of Stability Violation 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 9, 页码: 1627-1640 作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei 收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16 Aging  delay fault  online fault detection  soft error  stability violation
	A Loss Inference Algorithm for Wireless Sensor Networks to Improve Data Reliability of Digital Ecosystems 期刊论文 IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2011, 卷号: 58, 期号: 6, 页码: 2126-2137 作者:  Yang, Yu;  Xu, Yongjun;  Li, Xiaowei;  Chen, Canfeng 收藏  |  浏览/下载：69/0  |  提交时间：2019/12/16 Cyber-physical ecosystems (CPEs)  data aggregation  digital ecosystems (DEs)  network performance measurement  network tomography  wireless sensor networks (WSNs)
	Capture-power-aware test data compression using selective encoding 期刊论文 INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 205-216 作者:  Li, Jia;  Liu, Xiao;  Zhang, Yubin;  Hu, Yu;  Li, Xiaowei;  Xu, Qiang 收藏  |  浏览/下载：69/0  |  提交时间：2019/12/16 Test compression  Low-power testing  Scan-based testing
	Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文 INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191 作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16 Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing
	A New Multiple-Round Dimension-Order Routing for Networks-on-Chip 期刊论文 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2011, 卷号: E94D, 期号: 4, 页码: 809-821 作者:  Fu, Binzhang;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：70/0  |  提交时间：2019/12/16 network-on-chip (NoC)  fault-tolerant routing  multiple round dimension-order routing  turn model
	A SECURITY MECHANISM FOR RFID WITH DEPENDABLE PROXY 期刊论文 INTELLIGENT AUTOMATION AND SOFT COMPUTING, 2011, 卷号: 17, 期号: 6, 页码: 815-825 作者:  Zhou, Jun;  Xu, Yongjun;  Li, Xiaowei 收藏  |  浏览/下载：66/0  |  提交时间：2019/12/16 RFID  physical methods  security protocols  proxy  BAN logic