中国科学院计算技术研究所机构知识库

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限定条件	作者：Li, Huawei    第一作者

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	MRFI: An Open-Source Multiresolution Fault Injection Framework for Neural Network Processing 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 11 作者:  Huang, Haitong;  Liu, Cheng;  Xue, Xinghua;  Liu, Bo;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：3/0  |  提交时间：2024/05/20 Biological neural networks  Hardware  Reliability  Computational modeling  Neural networks  Fault tolerant systems  Fault tolerance  Fault evaluation  fault injection  fault simulation  multiresolution  neural network reliability
	Statistical Modeling of Soft Error Influence on Neural Networks 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 11, 页码: 4152-4163 作者:  Huang, Haitong;  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Luo, Tao;  Cheng, Long;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20 Fault analysis  fault simulation  neural network (NN) reliability  statistical fault modeling
	Exploring Winograd Convolution for Cost-Effective Neural Network Fault Tolerance 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 卷号: 31, 期号: 11, 页码: 1763-1773 作者:  Xue, Xinghua;  Liu, Cheng;  Liu, Bo;  Huang, Haitong;  Wang, Ying;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20 Fault tolerant systems  Fault tolerance  Artificial neural networks  Convolution  Reliability  Computational modeling  Neurons  Fault-tolerance  soft errors  vulnerability analysis  winograd convolution (WG-Conv)
	On-Line Fault Protection for ReRAM-Based Neural Networks 期刊论文 IEEE TRANSACTIONS ON COMPUTERS, 2023, 卷号: 72, 期号: 2, 页码: 423-437 作者:  Li, Wen;  Wang, Ying;  Liu, Cheng;  He, Yintao;  Liu, Lian;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：14/0  |  提交时间：2023/07/12 Training  Fault detection  Computational modeling  Image edge detection  Memristors  Neural networks  Kernel  Deep neural network  hard fault  ReRAM  reliability  soft fault
	Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484 作者:  Xu, Dawen;  Zhu, Ziyang;  Liu, Cheng;  Wang, Ying;  Zhao, Shuang;  Zhang, Lei;  Liang, Huaguo;  Li, Huawei;  Cheng, Kwang-Ting 收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01 Neural networks  Circuit faults  Hardware  Acceleration  Reliability  Analytical models  Computational modeling  Integrated circuit reliability  reliability
	STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296 作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei 收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12 Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)