中国科学院计算技术研究所机构知识库

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限定条件	作者：Hu, Yu    第一作者

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	Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2011, 卷号: 30, 期号: 3, 页码: 455-463 作者:  Wu, Shianling;  Wang, Laung-Terng;  Wen, Xiaoqing;  Jiang, Zhigang;  Tan, Lang;  Zhang, Yu;  Hu, Yu;  Jone, Wen-Ben;  Hsiao, Michael S.;  Li, James Chien-Mo;  Huang, Jiun-Lang;  Yu, Lizhen 收藏  |  浏览/下载：68/0  |  提交时间：2019/12/16 Aligned launch-on-capture  at-speed scan testing  double-capture  hybrid launch-on-capture  launch-on-capture  one-hot launch-on-capture  staggered launch-on-capture
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：41/0  |  提交时间：2019/12/16 microprocessor design-for-testability  test generation  built-in self-test  at-speed testing
	Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625 作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing 收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16 compression  run-length coding  random access scan  power dissipation  test application time