中国科学院计算技术研究所机构知识库

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限定条件	作者：Hu, Yu    第一作者

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	TSocket: Thermal Sustainable Power Budgeting 期刊论文 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2016, 卷号: 21, 期号: 2, 页码: 22 作者:  Chen, Guoqing;  Xu, Yi;  Hu, Xing;  Guo, Xiangyang;  Ma, Jun;  Hu, Yu;  Xie, Yuan 收藏  |  浏览/下载：51/0  |  提交时间：2019/12/13 Design  Management  Performance  Reliability  Power budgeting  performance optimization  thermal modeling  multicore system
	OWARE: OPERAND WIDTH AWARE REDUNDANT EXECUTION FOR WHOLE-PROCESSOR ERROR DETECTION 期刊论文 INTELLIGENT AUTOMATION AND SOFT COMPUTING, 2011, 卷号: 17, 期号: 6, 页码: 771-780 作者:  Hu, Yu;  Chen, Zhongliang;  Li, Xiaowei 收藏  |  浏览/下载：68/0  |  提交时间：2019/12/16 narrow-width value  sphere of replication  data-level redundancy  instruction-level redundancy
	A Domain Partition Model Approach to the Online Fault Recovery of FPGA-Based Reconfigurable Systems 期刊论文 IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2011, 卷号: E94A, 期号: 1, 页码: 290-299 作者:  Shang, Lihong;  Zhou, Mi;  Hu, Yu;  Yang, Erfu 收藏  |  浏览/下载：66/0  |  提交时间：2019/12/16 fault-recovery  FPGAs  reconfigurable systems  domain partition  fault-tolerance
	X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092 作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei 收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16 At-speed scan-based testing  low-power testing  X-filling
	Leakage current optimization techniques during test based on don't care bits assignment 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2007, 卷号: 22, 期号: 5, 页码: 673-680 作者:  Wang, Wei;  Hu, Yu;  Han, Yin-He;  Li, Xiao-Wei;  Zhang, You-Sheng 收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16 leakage current  don't care bits  minimum leakage vector  leakage power
	Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625 作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing 收藏  |  浏览/下载：45/0  |  提交时间：2019/12/16 compression  run-length coding  random access scan  power dissipation  test application time